IEC62132-3-BCI-(Bulk-Current-Injection)

47A/700/CDCOMMITTEEDRAFT(CD)IEC/TCorSC:SC47AProjectnumberIEC47A/62132-3/Ed.1TitleofTC/SC:IntegratedCircuitsDateofcirculation2004-06-04Closingdateforcomments2004-09-03AlsoofinteresttothefollowingcommitteesTCCISPR/77BSupersedesdocument47A/670/CD-47A/680A/CCFunctionsconcerned:SafetyEMCEnvironmentQualityassuranceSecretary:HisaoKasuga(Japan)[e-mail]AREINVITEDTOSUBMIT,WITHTHEIRCOMMENTS,NOTIFICATIONOFANYRELEVANTPATENTRIGHTSOFWHICHTHEYAREAWAREANDTOPROVIDESUPPORTINGDOCUMENTATION.Title:IEC62132-3,Ed1:IntegratedCircuits-Measurementofelectromagneticimmunity,150KHzto1GHz-Part3:BulkCurrentInjection(BCI),10KHzto!GHz,(Titre):IntroductorynoteThecharacterizationoftheimmunitylevelsofintegratedcircuitsisessentialtodefinetheoptimumdesignofaprintedcircuitboardandforintegrationwithinelectronicequipmentandsystems.Thisdocumentproposesamethodofmeasuringtheelectromagneticimmunityofintegratedcircuitstoelectromagneticdisturbances,whicharelimitedtocontinuousnarrowbandelectromagneticsignals.ThemeasuringmethodisbasedontheBCImethodusedtotesttheelectronicequipment.ItwasagreeduponbyWG9projectmembersonMarch9,2004thatthisdocumentwouldbecirculatedasthesecondCDtogathermorecommentsafterdiscussionon47A/680A/CCwasmadecarefully.FORMCD(IEC)2002-08-08Copyright©2004InternationalElectrotechnicalCommission,IEC.Allrightsreserved.Itispermittedtodownloadthiselectronicfile,tomakeacopyandtoprintoutthecontentforthesolepurposeofpreparingNationalCommitteepositions.Youmaynotcopyormirrorthefileorprintedversionofthedocument,oranypartofit,foranyotherpurposewithoutpermissioninwritingfromIEC.47A/700/CD2CONTENTSPART3:BULKCURRENTINJECTION(BCI)METHOD,10KHZ-1GHZ.............................................................41.SCOPE...........................................................................................................................................................................42.NORMATIVEREFERENCES....................................................................................................................................43.DEFINITIONS..............................................................................................................................................................44.GENERAL.....................................................................................................................................................................45.TESTCONDITIONS....................................................................................................................................................55.1ICTESTPLAN.................................................................................................................................................................55.2FREQUENCYRANGE........................................................................................................................................................55.3TESTSIGNALCHARACTERISTIC......................................................................................................................................65.4FREQUENCYSTEPSSIZES................................................................................................................................................65.5TESTIMMUNITYLEVELS.................................................................................................................................................66TESTSET-UP................................................................................................................................................................76.1INSTRUMENTATION........................................................................................................................................................76.2TESTPCB.......................................................................................................................................................................86.3TESTPCBFIXTURE.................................................................................................................................................97.TESTPROCEDURE....................................................................................................................................................97.1HAZARDOUSELECTROMAGNETICFIELDS.......................................................................................................................97.2CALIBRATIONOFFORWARDPOWERLIMITATION..........................................................................................................107.3DETAILEDTESTPROCEDURE.........................................................................................................................................118.TESTREPORT...........................................................................................................................................................12BIBLIOGRAPHY.............