164Kl8192*8ll8510ll-SPIl20MlEEPROMlSPI0&3(CPOL,CPHA=0,0&1,1)lll2.7V-3.65Vl1uAllFM25CL6464KFRAMRAM10EEPROMFRAMEEPROMFM25CL64FM25CL64FM25CL64FM25CL64EEPROMFM25CL64SPI2/CS1INSCK/CSSO2OUTSO/HOLDSOSOSI/WP3IN*FM25040/WPVSS4INSI5INSCK6IN0-5MHZ/HOLD7INMCU/HOLD/HOLDSCK/CS/HOLDSCKVDD8IN5V3FM25CL648192*8SPIEEPROMEEPROMFM25CL64FM25CL6481928SPI13.FM25CL64SPIFM25CL64SPIEEPROMFM24C256EEPROMFM25CL64EEPROMFM24C256EEPROMFM25CL64VDD-SPIFM25CL64SPI5MHZSPISPII/0FM25CL64SPI03SPI2FM25CL64SPI3FM25CL64SPISPIFM25CL64/CSSPISPIFM25CL6403303FM25CL64/CSSPI/CS/CS45FM25CL648SCK,D7FM25CL64WREN-FM25CL64WRENWRENWRENWELWEL=1WELWREN5WRENWRDI-writedisableWRDIWELWEL=06WRDI6RDSR-ReadStatusRegisterRDSRRDSRFM25CL64WRSR-WriteStatusRegisterWRSRWRSR/WPFM25CL64/WPWRSRWRENWRSRRDSRWRSRFM25CL64WRENWRENWRSR/WP.04-60EEPROMFRAMWPENBP1BP0WELWELBP1BP037BP1BP0WPEN/WPWPEN0/WPWPEN1/WPWPEN=1/WP=0BP1BP01WPEN1/WP0/WPWPENSPIFRAMSPIEEPROMFM25CL64WRENWRITE131FFFH0000HEEPROM,FM25CL64/CS13SI81FFFH0000H/HOLDSCK/HOLDSCK/HOLD/HOLDSCKSCKHOLD8EEPROM1FRAMSRAMEEPROM2FRAMFRAM3EEPROMEEPROMFRAM4EEPROMFRAMFM24C2565RF/IDFRAMRF/IDRFEEPROMFM24C256RF/ID6FRAMSFM24C2569StressesabovethoselistedunderAbsoluteMaximumRatingsmaycausepermanentdamagetothedevice.Thisisastressratingonly,andthefunctionaloperationofthedeviceattheseoranyotherconditionsabovethoselistedintheoperationalsectionofthisspecificationisnotimplied.Exposuretoabsolutemaximumratingsconditionsforextendedperiodsmayaffectdevicereliability.Notes1.SCKtogglingbetweenVDD-0.3VandVSS,otherinputsVSSorVDD-0.3V.2.SCK=SI=/CS=VDD.AllinputsVSSorVDD.3.VSSδVINδVDDandVSSδVOUTδVDD.4.Characterizedbutnot100%testedinproduction.10Notes1.tCH+tCL=1/fCK.2.Characterizedbutnot100%testedinproduction.3.Riseandfalltimesmeasuredbetween10%and90%ofwaveform.Notes111.Therelationshipbetweenretention,temperature,andtheassociatedreliabilitylevelischaracterizedseparately.Enduranceistheguaranteednumberofreadorwritecyclesperaddressthatcanbeperformedwhilemaintainingthespecifieddataretention.Itisunlikelytoreachthislimitformostapplications.12