Agilent_3070_系统介绍

Agilent3070系统介绍&软硬件综述概要Part13070系统介绍Part23070硬件综述Part33070软件综述Part4基本的测试原理Part13070系统介绍概要在线测试（ICT）在产线中的位置ICT基本测试原理Agilent3x7y系列测试界面–夹具安全事项测试程序开发流程测试工具在线测试（ICT）在产线中的位置SP505DXSeries5000SJ50SeriesIISJ50SeriesIIXLSJ50SeriesIIValue3070Series3目标:尽早的发现制造缺陷－降低PCB板的制造成本Agilent3070基本测试原理Agilent3070Agilent3070基本测试原理通常是PCB板安装完成后的第一次电学测试通过检测PCBA上的单个或多个元器件来验证器件值检查器件安放位置确认电路连接查找PCB制造中的缺陷（短路，开路，错件及零件错位等）常见制造缺陷焊点短路常见制造缺陷焊点开路常见制造缺陷零件安装错位常见制造缺陷零件翘起在线测试功能(Summary)模拟器件测试上电测试数字测试局部的功能测试精确测试特殊测试•验证PCB的安装过程•在测试阶段尽快消除明显PCBA上的零件错误•提供最佳的测试方案以取得最大的测试覆盖率Agilent3x7y系列5184nodes2592nodes1296nodesAgilent3x7y系列3X723X733X75TestCapabilities&StandardProducts:ShortsAnalogICTQuick70Short-wirefixturingPanelTestTestJetTestCapabilities&StandardProducts:ShortsAnalogICTAnalogfunctionalIn-circuitboundaryscanQuick70ShortwirefixturingPanelTestTestJetTestCapabilities&StandardProducts:ShortsAnalogICTanalogfunctionalin-circuitboundaryscanQuick70shortwirefixturingPanelTestTestJetDynamicTestAccessflashprogrammingsolutionPolarityCheckAgilent3x7y系列30703x71-unpowerorlimitedpowersystem3x72-ProcessTestSystem3x73-IncircuitTestSystem3x74-FunctionalTestSystem3x75-CombinationTestSystem3x79-TelecommunacationsTestSystem测试界面–夹具短线夹具的结构为什么选用短线夹具安全事项测试程序开发流程测试工具Part23070硬件综述OutlineAgilent3070的结构DUTPowerSupplyTestheadModuleDesignationsCardsinTestheadMotherCardModuleControlCardASRUCardPinCardAnatomyofAgilent3070AnatomyofAgilent3070(Cont.)DUTPowerSuppliesCurrentVoltageOutputNumberAgilent6621AHighLow2Agilent6624AMediumMedium4Agilent6634ALowHigh1Agilent6642AHighHigh1TestheadModuleDesignationsCardsintheTestheadMotherCardModuleControlCardAnalogStimulus-ResponseUnit(ASRU)CardPinCardsMotherCard提供系统内部板卡的DC电源SuppliesDCpower分配电信号到指定的ModuleControlCard解析地址DecodesaddressMotherCard(Cont.)MultiplexingtheASRUcardtopincardsbymothercardModuleControlCard控制实际的测试过程程序自动读取码(AutofileCode)带有8个通用开关(GPRelay)必须放在每个module的第6槽位四种类型:1.ControlCard2.ControlPlusCard3.ControlXTCard4.ControlXTPASRUCard提供正确的激励信号Appliestheappropriatestimulus使用测量运算放大器进行电压信号的测量MakesavoltagemeasurementwithMOA(MeasuringOperationalAmplifier)提供直流点信号和波形发生器ProvidesDCsourceandawaveformgenerator分配在1号槽Residesinslot1有A,B,C三个版本PinCardHybridDoubleDensityCardHybrid32CardChannelPlusCard(Nolongeravailable,butstillsupported)AccessPlusCardAnalogPlusCardSerialTestPlusCard(STC+)HybridDoubleDensityCardTwosides:SideA,SideBMUXratio(MINTpins:D/Rlines):9:216channelsx9pins=144MINTpinsHybrid32CardPart33070软件综述概要1.标准测试流程2.软件综述3.BT-Basic及相关命令4.3070操作步骤5.测试原理标准测试流程UnpoweredtestsShorts&PinstestingAnalogIncircuittestingTestJettestingSetupPowerSuppliesDigitalIncircuittestingAnalogPoweredtestingPoweredtests软件综述BT-Basic界面StatuslineCommandlineOperatingmodeProcessIDnumberWorkingspaceSpecialfunctionkeys快捷键F1–Edit/CommandF2–RecallPlusF3–RecallMinusF4–ExecuteF5–Mark/SecondMark/ClearMarkF6–TestConsultantF7–PushbuttonQSTATSF8–StoreLineF9–InsertLineF10–DeleteLineF11–ClearLineF12–ClearDisplay操作模式常用BT-Basic命令catchangechange“A”to“BA”changemchangem“cd”to“ab”copytocopyfile1todirectory2copyovercopyfile1overdirectory2/file3createdirdeleteduplicate常用BT-Basic命令editfind,findnfind“string1”,findn“string2”get,loadmergemerge“file1”;“file2”,5,6;“file3”movemsi,msi$numberscratchsave,re-savesave“file1”操作步骤打开系统的电源Turnonsystem用设定的用户名登陆Logonashp3070user打开BT-BasicOpenBT-Basic进入到待测板的目录Gettoboardtestdirectory输入：testheadpoweron,testheadis1输入：load“testplan”索紧夹具Fixturelock运行程式Run松开夹具Fixtureunlock输入：testheadpoweroff,testheadis*退出BT-Basic操作exit登出logoff关机shutdownTesthead操作命令testheadpoweron/offtestheadis1/*fixturelock/unlockfaon/faoffexitTesthead‘Config’fileTesthead‘Config’file(Cont.)Thefilemustbelocatedinthe/..3070/diagnostics/th1/directoryThefilemustbecompiledwiththetestheadoptionThetestheadmaynotbootiftheconfigfileinincorrectThistestheadconfigfileisdefinedduringtheinitialsysteminstallationThetestheadconfigfilemaynotbeusedasaboardlevelconfigfileBoard‘Config’filePart4基本的测试原理测试流程回顾‘testplan’模拟测试的基本原理常用测试选项的介绍BoardConsultantPushbuttonDebugOtherIssue标准测试流程UnpoweredtestsShorts&PinstestingAnalogIncircuittestingTestJettestingSetupPowerSuppliesDigitalIncircuittestingAnalogPoweredtestingPoweredtestsAnalogTest–“testplan”Analogtest-conceptAnalogtestbasicShortstestShortstest(Cont.)Expectsshorts−Jumpers−Closedswitches−Fuses−Smallvalueresistors−Etc.Unexpectedshorts−Highimpedancenodes−Digitalpins−Resistorsabove10kUnexpectedshorts−Lowimpedancenodes−Powernodes−Resistorsbelow10kShortstest(Cont.)PinstestResistivetestCapacitororInductortestStatementsyntaxCapacitorcapacitorvalue,+tol,-tol,return,comp/nocompDiodediodehi,lo,optionsResistorresistorvalue,+tol,-tol,optionsJumperjumperthreshold,optionsMeasurementoptionsBoardConsultantPushbuttonDebugBoardLevelDebugDeviceLevelDebugDeviceleveldebugAnalogDebugGentleremind对测试程序进行修改之前进行必要的备份Dobackupbeforeanymodification在修改的部分加入个人的识别编号以便于查询DoaddyourIDtothemodifiedparts在修改的部分加入注释以便于记忆Doad