Open-short-&-DC测试原理

FredTeng/KYEC1Lesson1DCTestTheoryFredTeng/PEDept.MCPDiv/KYEC2002/5/22FredTeng/KYEC2DCParametricTestItemsTestdonebyprecisionmeasureunit(PMU)IDDLeakageInputparameters:VIH,VIL,IIH,IILOutputparameters:VOH,VOL,IOH,IOLPowerconsumptiontest:Static,Gross,&DynamicIddFredTeng/KYEC3Open/ShortTest-100uA-0.65VPMUforcesenseforceMeasureVss=0Vdd=0-100uAFailShortPassFailOpenGT–0.2VLT–1.5VProcedure•Groundallpins(includingVDD)•UsingPMUforce–100uA,onepinatatime•Measurevoltage•Failopentestifthevoltageislessthan–1.5V•Failshorttestifthevoltageisgreaterthan–0.2VFredTeng/KYEC4Open/ShortTestQ&AWhydoesdevicehave2diodes?WhywetestonlyGNDsidediodeusually?WhyweuseFIMVmodetotestO/Snormally?WhywetestO/Sbeforeanyothertestitems?Whenyousetupatester,youfindaspecificDUTwhichfailatopen.Howcanyoufindouttherootcause?Whenyousetupatester,youfindaspecificDUTwhichfailatshort.Howcanyoufindouttherootcause?FredTeng/KYEC5InputLeakageLowTest(IIL)0V0mAPMUforcesenseforceMeasureVss=0VDDmaxPassFailIILLT–10uAProcedure•ApplyVDDmax•Pre-conditionallinputpinstologic‘1’withPE•UsingPMUforceGroundtoindividualpin•Waitfor1to5msec•Measurecurrent•FailIILtestifthecurrentislessthan–10uAIILVLSIPEsforcelogic1OnallinputpinsFredTeng/KYEC6InputLeakageHighTest(IIH)5.25V0.00mAPMUforcesenseforceMeasureVss=0VDDmaxPassFailIIHGT10uAProcedure•ApplyVDDmax•Pre-conditionallinputpinstologic‘0’withPE•UsingPMUforceVDDMAXtoindividualpin•Waitfor1to5msec•Measurecurrent•FailIIHtestifthecurrentisgreaterthan+10uAVLSIPEsforcelogic0OnallinputpinsIIHFredTeng/KYEC7OutputVoltageTest(Voh/Ioh)-5.2mA4.3VPMUforcesenseforceMeasureVss=0VDDmaxPassFailVOHLT2.4VProcedure•ApplyVDDmax•Pre-conditionalloutputpinstologic‘1’•UsingPMUforceIOHcurrentperspecification•Waitfor1to5msec•Measurevoltage•FailVOHtestifthevoltageislessthan+2.4uAVLSIIOHFredTeng/KYEC8OutputVoltageTest(Vol/Iol)8.0mA0.15VPMUforcesenseforceMeasureVss=0VDDmaxPassFailVOLGT0.4VProcedure•ApplyVDDmax•Pre-conditionalloutputpinstologic‘0’•UsingPMUforceIOLcurrentperspecification•Waitfor1to5msec•Measurevoltage•FailVOLtestifthevoltageisgreaterthan+0.4uAVLSIIOLFredTeng/KYEC9OutputShortCircuitTest0.0V-52.4mAPMUforcesenseforceMeasureVss=0VDDmaxPassFailShortCircuitGT–30mAProcedure•ApplyVDDmax•Pre-conditionalloutputpinstologic‘1’•UsingPMUforce0V•Waitfor1to5msec•Measurecurrent•FailVOLtestifthecurrentisoutsidethelimitrangeVLSIFailShortCircuitLT–85mAIOSFredTeng/KYEC10StaticIddTest5.25V19.2uAPMUforcesenseforceMeasureVss=0VDDPassFailStaticIDDGTIDDspecProcedure•UsingDPSorPMUtoapplyVDDmaxonpowerpin•ExecutePre-conditionpattern•Stoppattern•Waitfor1to5msec•MeasurecurrentflowingintoVDDpins•FailIsbtestifthecurrentisgreaterthanIsbspec.(NormalinuA)VLSIIDDFredTeng/KYEC11GrossIddTest5.25V8.7mAPMUforcesenseforceMeasureVss=0VDDPassFailGrossIDDGTIDDspecProcedure•UsingDPSorPMUtoapplyVDDmaxonpowerpin•SetPass/Faillimit•SetallinputpinsLow/HighorExecuteresetsequence•Stoppattern•Waitfor1to5msec•MeasurecurrentflowingintoVDDpins•FailIsbtestifthecurrentisoutsideIDDgrossspec.VLSIIDDFailGrossIDDFredTeng/KYEC12DynamicIddTest5.25V12.4mAPMUforcesenseforceMeasureVss=0VDDPassFailDynamicIDDGTIDDspecProcedure•UsingDPSorPMUtoapplyVDDmaxonpowerpin•ExecutePre-conditionpattern•Waitfor10msec•MeasurecurrentflowingintoVDDpinswhiledeviceisexecutingpattern•FailIsbtestifthecurrentisgreaterthanIDDspec.(NormalinmA)•StoppatternVLSIIDD