静电力显微镜

!#!$%!#$%&’()*+%,-,.’,/0$%1+/$-/234/+,03&’()!*’+#!$)%$)%!,$!$#)!#!)%-.#/.0*$%0*.1!2!$)$),!$)#)!34564788789:;887890=88(78957;?’@;’A:05+$$8B:05:;88789C?’D57;?’@;’A:C5$E(;F?’@FF7;G’?;57;?’@;’AEG5$!:7#*.#3HEG5EG5!-$11/:;88789HA;7F8;57;?’@;’A:H5:7I!-:7-.:H5-56!.71EG5:H52F’B7;G’?;57;?’@;’A2G5!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!#$#%&’!()*+,%-./01#$#$!!2%13405/6!7789:;/))%#$=#?*)/+@?,A#$BC5D$0EFG!77!H$IJ/?K/)68+4L!#$%!!#$%$&’!()*++#$%,-.//&/’012+,13&0.’&/’#$%BMMDMN!#$%&’()#*’&+,)-.%/0121’13)456755’895!!#756955’8:;955’8.!#75’8956955’8990=’955’897?@775!#!$%&’’()*#$+,-./012$+34/567894.77/4:&;&&’’9/479=56&?0,(@A!,&A&’’BC-+!DE-4DF$%&G’(;?HBGIJCKL5-00M0NO/--4PQM/+D$5=.F7M5#M54=F5=R/LO$#A!,G0,&B?(0,$#&?(0,&0,&B&#CKLO$#&IL8#&’A!,0,!#S!(!!(!(S!#S2%*44/77%:.-7/L%#?(?&TUC=0N!#LMV?SLMSA;?;S!#$%&’(&)*+,-+(&)*+,-...**/0,123345,-)**678*9%:+.*;$1=-%5&12%-?&678*9%:++!#!@23’&=A$1&4;$$B7.03C5-%DEFC323:/GG-1C3:3’-%H2&IJKI-H2=C&’$A?5-$%13B31-53%1&:&3’?C&:&%53%4B$5&%5-$:&5CLFLM$C1&:-1C$’1$BLKEBBA@2L’;&55.NOO7*.6..96K*PA?2:IG343’EG-&’&%43%H&CQ0&L&CJJ,R1R&’%-3;KSA&15C$’535-1M$C1&:-1C$’1$BL$%M&CC$&A&15C-1-%-%&C5H3’35:$’B2&C&K@2L’Q&TP77.NNU!K6/$:3%’LJ;&%HDG-AA-3:’((3%353@&5&A&%R/K03BB-%H$M:$F-A&123CH&’$%-%’?A35$C’?CM31&’V-52U6**9!!#$%&’$($)#*&%#!+)#%&’#&,!-.,,/01’2!$$3445653735-89&:;=0):?@(:;A@BCD@0)+EF(:;G)/(%C-2&#(#0(%;!$%(,,):;(:HH!$!#$)&:&*$%(,,!H#0(%;!I1’#(::):;#(,(#)$(:#!+)#%&’#&,!):$0!)JKL)’1’$!+-.,,/01’2!$$3444M73M6N-7--KNNN-6O!%%)’PQ$!%:RSB;(%Q?(+):9-2&#()T!H#0(%;!*&%#!+)#%&’#&,1-U(##)O!#0:&344N.V35M8-M(B%!:I(#0WO!%%)’PQ-X+(;):;&**!%%&!!#$%)#H&+():Y(’I1*&%#!+)#%&’#&,1-.,,/01’2!$$344N763MN5-V=!(Z!%?S.I%(0(+Q(Z)H=-9);0G%!’&B$)&:($&+)#*&%#!+)#%&’#&,1,&$!:$)&+!$%1-U(##)O!#0:&3443P453774-49&:;=/(%C(:;G)@0)+EF-?!(’B%!+!:$&*0(%H:!’’’B%*(#!,&$!:$)((:H#0(%;!H)’$%)IB$)&:Y)$0H1:(+)##&:$(#$+&H!!!#$%&’$($)#*&%#!+)#%&’#&,!-.,,/01’2!$$3444MN3M57-3N=($(:(I!9(:!@J01!OX$&?F&$&O-R!#$%&’$($)#*&%#!+)#%&’#&,!)+(;):;(:(1T!HI1’B%*(#!#0(%;!+!$0&H-U(##)O!#0:&3445P3373MM8-33--344V3GKM4GV5-3K9&:;=@0)+EF9&B./(%C(:;G)-O(,,):;+&H!($&+)#*&%#!+)#%&’#&,1B’):;!!#$%&’$($)#*&%#!+&HB($)&:-.,,/01’2!$$344664KV53-35.I%!#0$OSF%B$$!%/!$(-.,,/01’3443646VV-38WZ!%C):;?R--34V7-37F!%$F�!$(-.,,/01’2!$$344868678-36RHY(%H’9(!$(-W(’$0);0G%!’&B$)&:($&+)#*&%#!+)#%&’#&,1B’):;([B(%$T$B:):;*&%C(’(#$B($&%(:H’!:’&%-.,,/01’344MVK54VN-3M--3444-3V--KNNN853G5K-34--KNNN73G5-KNP(%%!$$SA\B($!AW-A0(%;!’$&%(;!):(:)$%)H!G&])H!G’)#&:+!H)B+I1’#(::):;#(,(#)$(:#!+)#%&’#&,1-.,,/01’3443MN7KMK7-K3P(%%!$$SA\B($!AW-^$%(+)#%&’#&,1344K8KG88K6K-KK&:!’OP%)H;!%/??(%’0J?#F)OA-A0(%;!’$&%(;!):A!JKL)LA!JKL)333’$%B#$B%!’I1!!#$%&’$($)#*&%#!+)#%&’#&,1-.,,/01’2!$$3444M735K6-K5#0((H$Q?DBRO(:C(%P!%C&Y)$T.R-A0(%;!’$&%(;!):A&:(:&#B’$!%’!+I!H!H):)JKI1’#(::):;*&%#!+)#%&’#&,1-.,,/01’2!$$344VM88MK-!#$$%$&’(’)*+,)#)%-%*+,+.’#$/0#*&’)*#..%$&1/’)*#..%$&)’0$%23’,=._FE0)G1&:;E9._F9&:;G0()P.J)(:GI):F^J=!:G+):;=._F‘B!G*(:;#0&&&*?!#0(:)#(#)aR:;9B(T0&:;^:)Z!%’)$1&*#)aO!#0=B0(:85NNM8A0):(-45,)*#)O0)’,(,!%):$%&HB#!’’#(::):;!!#$%&’$($)#+)#%&’#&,!+!(’B%!+!:$(:H#0(%;!$%(,,):;LH!$%(,,):;B’):;RW?$!#0:)[B!’$0!)%($!’$H!Z!&,+!:$(:H)::&Z($)Z!$!:H!:#1-O0!*&%+!%0(’I!!:Y)H!1B’!H):+!(’B%):;’B%*(#!#0(%;!H!:’)$1’B%*(#!,&$!:$)(&*’!+)#&:HB#$&%(:H*!%%&!!#$%)#H&+():Y(’-O0!&$0!%0(’I!!:!],!#$!H$&’$BH1$0![B($B+H!Z)#!’Y)$0$0!’$&%(;!(I))$1(:H,%&#!’’):;Z!&#)$1+&%!$0&B’(:H’&*$)+!’$0(:$0!#&:Z!:$)&:(H!Z)#!’-O0)’,(,!%(’&,(1’+&%!($$!:$)&:$&$0!C!1$!#0:)[B!’&*RW?I(’!H&:$B:):;*&%C(:H$0!)%’&B$)&:’):$0!:!(%*B$B%!-6’78+*/,/?W?RW?#0(%;!’$&%(;!M5K5L扫描静电力显微镜及其电荷捕获/释放技术作者：王志勇，张鸿海，鲍剑斌，郭文明，汪学方作者单位：华中科技大学机械科学与工程学院,刊名：电子显微学报英文刊名：JOURNALOFCHINESEELECTRONMICROSCOPYSOCIETY年，卷(期)：2001，20(3)被引用次数：2次参考文献(23条)1.MartinY.AbrahamDW.WickramasingheHKHigh-resolutioncapacitancemeasurementandpotentiometrybyforcemicroscopy1988(13)2.BluhmH.WadasA.WiesendangerR.MeyerKK,SzczesniakLElectrostaticforcemicroscopyonferroelectricininertgasatmosphere19963.DomanskyK.LengY.WilliamsCC.JanataJ,PetelenzDMappingofmobilechargesoninsulatorsurfaceswithelectrostaticforcemicroscope19934.HongJW.ShinSM.KangCJ.KukY,KhimZG,Sang-ilParkLocalchargetrappinganddetectionoftrappedchargebyscanningcapacitancemicroscopeintheSiO2/Sisystem19995.白春礼扫描力显微术20006.TerrisBD.SternJE.RugarD.MaminHJLocalizedchargeforcemicroscopy1990(01)7.SaurenbachF.TerrisBDImagingofferroelectricdomainwallsbyforcemicroscopy19908.WeaverJMR.AbrahamDavidWHigh-resolutionatomicforcemicroscopypotentiometry1991(03)9.HongJW.ParkSang-il.KhimZGMeasurementofhardness,surfacepotentialandchargedistributionwithdynamiccontactmodeelectrostaticforcemicroscope199910.WatanabeS.HaneK.OhyeT.ItoM,GotoTElectrostaticforcemicroscopeimaginganalyzedbysurfacechargemethod1993(05)11.白春礼.田芳扫描力显微镜1998(1-2)12.HongJW.KhimZG.HouAS.ParkSang-ilTappingmodeatomicforcemicroscopyusingelectrostaticforcemodulation199613.AlbrechtTR.GrutterP查看详情199114.FverkingME晶体振荡器设计与温度补偿198515.GertGoch查看详情199416.EdwardsHalFast,high-resolutionatomicforcemicroscopyusingaquartztuningforkasactuatorandsensor1997(03)17.曾灵丹扫描近场声显