贝克休斯随钻测井工具

©BakerHughesIncorporated.AllRightsReserved.|16.随钻测井工具LoggingWhileDrillingFormationEvaluationApril2nd,2010©2009BakerHughesIncorporated.AllRightsReserved.©2009BakerHughesIncorporated.AllRightsReserved.2©2009BakerHughesIncorporated.AllRightsReserved.内容提要1.随钻测井地层评价技术概述2.随钻定量评价砂泥薄互层油气藏3.随钻地震和井间压裂实时监测©BakerHughesIncorporated.AllRightsReserved.|33CopyrightBakerHughesInc.2007随钻地层评价技术随钻测量数据传输电阻率放射性测井高级地层评价:地层压力伽玛成像电成像核磁共振地震测井声波TelecoTelecoNaviTrakNaviTrakOnTrakOnTrakGyroTrakGyroTrakBCPMIIBCPMIIEMEMTelmetryTelmetry数字钻杆数字钻杆侧向电阻率侧向电阻率(RGD)(RGD)双频传播电阻率双频传播电阻率(DPR)(DPR)多频传播电阻率多频传播电阻率(MPR(MPR))DeepTrakDeepTrak三重组合随钻测量三重组合随钻测量LithoTrakLithoTrakSoundTrakSoundTrakTesTrakTesTrakAz.GammaAz.GammaStarTrakStarTrakMagTrakMagTrakSeismicSeismicCheckshotCheckshot©2009BakerHughesIncorporated.AllRightsReserved.4贝克休斯随钻测井地层评价技术系列•随钻自然伽玛和电阻率测井–OnTrak（LWD/MWD)•随钻方位电阻率测井–AziTrak•随钻中子密度孔隙度测井–LithoTrak•随钻声波测井–SoundTrak•随钻地层压力测试器–TesTrak•随钻高分辨率电阻率成像测井–StarTrak•随钻核磁共振测井–MagTrak•钻头电阻率–ZoneTrakTMTM贝克休斯公司英特的标志–工具以TRAK结尾©2009BakerHughesIncorporated.AllRightsReserved.5BakerHughesKeyLWDFormationEvaluationServices&TechnologiesGeologicalInterpretationImagingPressureManagementWellborePlacementReservoirNavigationFluidSaturationReserveEstimatesRockQuality(k)FluidTypingGeologicalInterpretationImagingPressureManagementWellborePlacementReservoirNavigationFluidSaturationReserveEstimatesRockQualityFluidTyping©2009BakerHughesIncorporated.AllRightsReserved.6贝克休斯英特随钻测井工具组合贝克休斯英特随钻测井工具组合BCPMAutoTrakG3双向通讯和导电模块AutoTrakG3导向短节ATKG3OnTrak™OnTrak传感器模块井筒压力4.7m(15.4ft)自然伽玛+自然伽玛成像5.0m16.4ft)电阻率6.1m(20.0ft)方位7.8m(25.6ft)振动和粘滑7.8m25.6ft)TesTrak™井斜1.0m(3.1ft)地层压力测试器LithoTrakTM体积密度+密度成像15.6m(51.2ft)井径校正中子孔隙度18.0m(59.0ft)井径16.0m(52.5ft)22.1m(72.5ft)45.0m(147.6ft)34.3m(112.5ft)核磁共振声波MagTrak™SoundTrak™©2009BakerHughesIncorporated.AllRightsReserved.7OnTrak–随钻自然伽玛和电阻率测井©2009BakerHughesIncorporated.AllRightsReserved.82MHz2MHz补偿电阻率补偿电阻率•注意:400kHz具有相同的模式P42HMA42HMP41HMA41HMP31HMA31HMP32HMA32HMT2R2R1T1T4T3P22HMA22HMP12HMA12HMP21HMA21HMP11HMA11HMPD12HMAT12HMPDBCHXATBCHXRPCSHMRACSHMRPCSHXRACSHXPD34HMAT34HMPDBCSHXATBCSHXRPCHMRACHMRPCHXRACHX3地面电脑的处理步骤1)应用空气零长2)电阻率转换3)井眼校正井下工具计算相位差和衰减电阻率长源距短源距井下工具计算相位差和衰减电阻率3地面电脑的处理步骤1)应用空气零长2)电阻率转换3)井眼校正©2009BakerHughesIncorporated.AllRightsReserved.9曲线命名规则•最终曲线(8条)补偿和校正短源距内存RPCSM或A=衰减缺失代表长源距H或L=低频高频电阻率相位差或X=实时©2009BakerHughesIncorporated.AllRightsReserved.10随钻测井工具OnTrak技术参数•RPCEHM—0.1~3000欧姆.米RPCELM—0.1~1000欧姆.米•RACEHM—0.1~500欧姆.米RACELM—0.1~200欧姆.米•MPRTEQ是英特公司专门针对随钻电阻率测井的原始测量值进行固定探测深度的电阻率处理程序，同时它消除了各向异性和介电常数变化对电阻率的影响。经过处理，可以获得探测深度分别为10”,20”,35”,60”和120”的电阻率值。©2009BakerHughesIncorporated.AllRightsReserved.11探测深度0102030405060708090„Rt=1/Rxo=0.1„Rt=10/Rxo=1„Rt=100/Rxo=10400kH400kH衰减衰减400kH400kH衰减衰减短源距短源距2MH衰减2MH衰减短源距探测半径探测半径(in)2MH相位差短源距400kH400kH相位差相位差2MH相位差400kH400kH相位差相位差短源距短源距90”48”39”16”17”22”23”18”21”26”33”28”23”59”47”49”36”82”35”29”13”24”18”30”衰减相位差探测半径探测半径©2009BakerHughesIncorporated.AllRightsReserved.12随钻测井与电缆测井的电阻率对比©2009BakerHughesIncorporated.AllRightsReserved.13OnTrakRawData+AdvancedProcessing=EnhancedReserves©2009BakerHughesIncorporated.AllRightsReserved.LithoTrakPorosityAdvanced Processed OnTrakResistivityOnTrakGamma RayWater Saturation©2009BakerHughesIncorporated.AllRightsReserved.14GammaRay–AzimuthalImaging©2009BakerHughesIncorporated.AllRightsReserved.SectoredGamma Ray ImageGamma Ray©2009BakerHughesIncorporated.AllRightsReserved.15‰8扇区内存成像‰8扇区实时传输‰实时层界面和地层倾角解释自然伽玛成像(OnTrak)©2009BakerHughesIncorporated.AllRightsReserved.16•AziTrak--方位电阻率©2009BakerHughesIncorporated.AllRightsReserved.17Modeled OnTrakTool ResponseCurve separation indicates approaching bed boundaryDo we steer up or down?ShaleReservoirNavigation–ChallengesinWellborePlacementShale©2009BakerHughesIncorporated.AllRightsReserved.18AziTrak™-BedBoundaryDetectionwPlacingtworeceiverscoilsfullyorthogonalinaMultiplePropagationResistivitytool,allowsustomeasureazimuthalinformationofthesurroundingenvironmentwhilethetoolrotates©2009BakerHughesIncorporated.AllRightsReserved.19CopyrightBakerHughesInc.2008AziTrakTM–Real-timeDeepAzimuthalResistivityImaging©2009BakerHughesIncorporated.AllRightsReserved.20CopyrightBakerHughesInc.2008AziTrakTM–Real-timeDeepAzimuthalResistivityImaging©2009BakerHughesIncorporated.AllRightsReserved.21钻头电阻率ZoneTrakTMTM©2009BakerHughesIncorporated.AllRightsReserved.22ZoneTrakTM–ResistivityatBit‰Enablesgeostoppingbyformationchangedetection‰Casingpointselection‰Corepointselection‰Wellborestability/over-pressuredzones‰Geologicalinterpretationwithseismiccorrelation‰Saltdrillingapplications–exitandentry‰OperatesinbothWBMandOBMenvironments‰Currentsatreceiverusedtodetermineapparentresistivity©2009BakerHughesIncorporated.AllRightsReserved.LWDLWDResistivity Resistivity at  Bitat  Bit©2009BakerHughesIncorporated.AllRightsReserved.23ZoneTrakTM–ResistivityatBit-GeostoppingFormation Change !!!21 ft©2009BakerHughesIncorporated.AllRightsReserved.24LithoTrak--随钻中子密度孔隙度测井©2009BakerHughesIncorporated.AllRightsReserved.25Feetx560x610x660x710x760x810Feet•一个提供下述测量值的随钻测井工具:–体积密度(ρb)–中子孔隙度–井径