加速寿命试验技术综述

25420047ACTAARMAMENTARIIVol.25No.4Jul.2004加速寿命试验技术综述张春华温熙森陈循(,,410073)加速寿命试验是可靠性试验技术一个重要的分支,相关的研究受到了统计学界与可靠性工程界的广泛关注本文对加速寿命试验领域的相关理论研究与工程实践作了阶段性的总结,对下一步的研究具有一定的启发意义文中首先介绍了加速寿命试验的有关概念,接下来分恒定应力试验的统计分析步进应力试验的统计分析序进应力试验的统计分析以及加速寿命试验的优化设计4个专题对加速寿命试验的相关研究进行了概述,然后简要回顾了加速寿命试验在我国的工程应用情况,最后对该领域将来的研究方向进行了展望系统工程;加速寿命试验;恒定应力试验;步进应力试验;序进应力试验;可靠性TB114.3,,,,,,1967[1]:(ALT),,,,,,,,,()(),20036,20045,,,70,,,[1~16]11.160,,19814(GB2689.1~481)[52~55]MazzuchiTASoyerRBayes,[17]HiroseH,,[18]WatkinsAJWeibull,,[19]BugaighisMM()Weibull[20]McLinnJA,[21]WangWKececiogluDB,0,WKMLE,Weibull[22],(BGLUE,RGLUE)(BGLIE,RGLIE),[23],,[24]1.2()(StepLoad)[56]1961,DodsonGAHowardBT[57],(),,1980NelsonWBNelson[25],,,NelsonWB,NelsonWB,BhattacharggaGK[26]TyoskinOIKrivolapovSY,[27]LCYSNelsonWB,(LCEM)NelsonWB,LCEM[28],[29],(MLE),MLE,[30~32]Weibull,,[59]Weibull,[60],,,1.3,,1958,KimmelJ,,,MLE[33][33],,WeibullV(t)=kt[61~62],[36],,[34]486兵工学报25[35][63][64]1997Weibull,[64][61,62],,C[65],[66],,,,,1.4,(),,,()ChernoffH[37],70MeekerWQNelsonWB,[38~40]MeekerWQWeibull,(),,[67],,Weibull4[43]Weibull,[49]MillerRNelsonWB[41]BaiDS[42]KhamisIHHigginsJJ3,[44]YeoKPTangLC,,,[45],k[46],[47~48],,BaiDS,[50],,,[51]2,,[13~15]HeNe,701981HeNe,,[3~5],[70][8],,[7],1/3,10[9,71],JB/DQ3205487486.[11,69],1989[68]3(1),,,[66,73~75](2),,(3),,,,(4),,(5),,(6)(CAE),CAECAE,[2]CAE4,,,1YurkowskyW,SchafterRE,FinkelsteinJM.Acceleratedtestingtechnology.TechnicalReportNO.RADCTR67420,1967:1~22,..,1997(2):109~1133,.HeNe.,16(7):410~4124,..,1998,22(3):179~1845,..,14(4):213~2156,..,1999,26(3):46~497,..,1996(3):23~288,,..,1994,10(4):442~4459..,1995,21(4):124~12910,..,1995.1111,,,..,1990,6(1):108~11212,,..,1999,21(4):33~3613,,..,2000,22(1):47~5014,,..,2000,22(2):37~4015,..,2000,22(4):57~6016,,.488兵工学报25.,2000(7):33~3417MazzuchiTA,SoyerR.Dynamicmodelsforstatisticalinferencefromacceleratedlifetests.In:IEEEProceedingsofAnnualReliabilityandMaintainabilitySymposium,1990.67~7018HiroseH.Estimationofthresholdstressinacceleratedlifetesting.IEEETransactionsonReliability,1993,42(4):650~65719WatkinsAJ.Review:Likelihoodmethodforfittingweibullloglinearmodelstoacceleratedlifetestdata.IEEETransactionsonReliability,1994,43(3):361~36520BugaighisMM.Exchangeofcensorshiptypesanditsimpactontheestimationofparameterofaweibullregressionmodel.IEEETransactionsonReliability,1995,44(3):496~49921McLinnJA.Newanalysismethodsofmultilevelacceleratedlifetests.In:IEEEProceedingsofAnnualReliabilityandMaintainabilitySymposium,1999.38~4222WangW,KececiogluDB.Fittingtheweibullloglinearmodeltoacceleratedlifetestdata.IEEETransactionsonReliability,2000,49(2):217~22323,..(A),1997,12(4):417~42424,.Weibull.(),2000,21(4):78~8125NelsonWB.Acceleratedlifetestingstepstressmodelsanddataanalysis.IEEETransactionsonReliability,1980,29(2):103~10826BhattacharggaGK,SoejoetiZA.Atamperedfailureratemodelforstepstressacceleratedlifetest.CommunicationsinStatisticsTheory&Method,1989,18(5):1627~164327TyoskinOI,KrivolapovSY.Nonparametricmodelforstepstressacceleratedlifetesting.IEEETransactionsonReliability,1996,45(2):346~35028TangLC,SunYS,etal.Analysisofstepstressacceleratedlifetestdata:Anewapproach.IEEETransactionsonReliability,1996,45(1):69~7429..,1985,8(3):311~31630,.Weibull.,1992,7(2):150~15931GeGuangping,MaHaixun,HeYouhua.DataanalysisfromacceleratedlifetestusingstepstressandWeibulldistribution.ICRMS,Beijing,1994.32,..,1996,9(1):39~4133YinXiangkang,ShengBaozhong.Someaspectsofacceleratedlifetestingbyprogressivestress.IEEETransactionsonReliability,1987,36(1):150~15534,..,1991(2):61~6635,..,1995(4):1~836..,1991,7(3):330~33537ChernoffH.Optimalacceleratedlifedesignsforestimation.Technometrics,19624(3):381~40838MeekerWQ,NelsonWB.OptimumacceleratedlifetestsfortheWeibullandextremevaluedistributions.IEEETransactionsonReliability,1975,24(6):321~33239NelsonWB,KielpinskiTJ.Theoryforoptimumcensoredacceleratedlifetestsfornormalandlognormaldistributions.Technometrics,1976,18(1):105~11440NelsonWB,MeekerWQ.TheoryforoptimumcensoredacceleratedlifetestsforWeibullandextremevaluedistributions.Technometrics,1978,20(2):171~17741MillerR,NelsonWB.Optimumsimplestepstressplansforacceleratedlifetesting.IEEETransactionsonReliability,1983,32(1):59~6542BaiDS,KimMS,LeeSH.Optimumsimplestepstressacceleratedlifetestswithcensoring.IEEETransactionsonReliability,1989,38(5):528~53243YangGuangbin.Optimumconstantstressacceleratedlifetestplans.IEEETransactionsonReliability,1994,43(4):575~58144KhamisIH,HigginsJJ.Optimum3stepstepstresstests.IEEETransactionsonReliability,1996,45(2):341~34545YeoKP,TangLC.Planningstepstresslifetestwithatargetaccelerationfactor.IEEETransactionsonReliability,1999,48(1):61~6746..,1994,10(1):52~6147,.Weibull.,1998,4(3):247~25248,.Weibull.,1998,4(4):383~38949,..(),1999,33(4):337~34250BaiDS,ChaMS,ChungSM.OptimumsimpleramptestsfortheWeibulldistributionandtypecensoring.IEEETransactionsonReliability,1992,41(3):407~41351GeGuangping,MaXuefeng.Optimumsimpleramptestsforthelognormaldistribution.In:ProcofTheFourthConferenceofAPORS,Melbourne,1997.52GB2689.181...1981.1053GB2689.281.()..1981.1054GB2689.