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JEDECSTANDARDTemperature,Bias,andOperatingLifeJESD22-A108-B(RevisionofJESD22-A108-A)DECEMBER2000JEDECSOLIDSTATETECHNOLOGYASSOCIATIONNOTICEJEDECstandardsandpublicationscontainmaterialthathasbeenprepared,reviewed,andapprovedthroughtheJEDECBoardofDirectorslevelandsubsequentlyreviewedandapprovedbytheEIAGeneralCounsel.JEDECstandardsandpublicationsaredesignedtoservethepublicinterestthrougheliminatingmisunderstandingsbetweenmanufacturersandpurchasers,facilitatinginterchangeabilityandimprovementofproducts,andassistingthepurchaserinselectingandobtainingwithminimumdelaytheproperproductforusebythoseotherthanJEDECmembers,whetherthestandardistobeusedeitherdomesticallyorinternationally.JEDECstandardsandpublicationsareadoptedwithoutregardtowhetherornottheiradoptionmayinvolvepatentsorarticles,materials,orprocesses.BysuchactionJEDECdoesnotassumeanyliabilitytoanypatentowner,nordoesitassumeanyobligationwhatevertopartiesadoptingtheJEDECstandardsorpublications.TheinformationincludedinJEDECstandardsandpublicationsrepresentsasoundapproachtoproductspecificationandapplication,principallyfromthesolidstatedevicemanufacturerviewpoint.WithintheJEDECorganizationthereareprocedureswherebyanJEDECstandardorpublicationmaybefurtherprocessedandultimatelybecomeanANSI/EIAstandard.Noclaimstobeinconformancewiththisstandardmaybemadeunlessallrequirementsstatedinthestandardaremet.Inquiries,comments,andsuggestionsrelativetothecontentofthisJEDECstandardorpublicationshouldbeaddressedtoJEDECSolidStateTechnologyAssociation,2500WilsonBoulevard,Arlington,VA22201-3834,(703)907-7560/7559or:PleaserefertothecurrentCatalogofJEDECEngineeringStandardsandPublicationsorcallGlobalEngineeringDocuments,USAandCanada(1-800-854-7179),International(303-397-7956)PrintedintheU.S.A.AllrightsreservedPLEASE!DON’TVIOLATETHELAW!ThisdocumentiscopyrightedbytheElectronicIndustriesAllianceandmaynotbereproducedwithoutpermission.Organizationsmayobtainpermissiontoreproducealimitednumberofcopiesthroughenteringintoalicenseagreement.Forinformation,contact:JEDECSolidStateTechnologyAssociation2500WilsonBoulevardArlington,Virginia22201-3834orcall(703)907-7559JESD22-A108-BPage1TestMethodA108-B(RevisionofTestMethodA108-A)TESTMETHODA108-BTEMPERATURE,BIAS,ANDOPERATINGLIFE(FromJEDECBoardBallotsJCB-99-89andJCB-99-89A,formulatedunderthecognizanceofJC-14.1CommitteeonReliabilityTestMethodsforPackagedDevices.)1PurposeThistestisusedtodeterminetheeffectsofbiasconditionsandtemperatureonsolidstatedevicesovertime.Itsimulatesthedevices’operatingconditioninanacceleratedway,andisprimarilyfordevicequalificationandreliabilitymonitoring.Aformofhightemperaturebiaslifeusingashortduration,popularlyknownasburn-in,maybeusedtoscreenforinfantmortality-relatedfailures.Thedetaileduseandapplicationofburn-inisoutsidethescopeofthisdocument.1.1ApplicabledocumentsEIA/JESD47Stress-TestDrivenQualificationofIntegratedCircuitsEIA/JEP122FailureMechanismandModelsforSiliconSemiconductorDevices2ApparatusTheperformanceofthistestrequiresequipmentthatiscapableofprovidingtheparticularstressconditionstowhichthetestsampleswillbesubjected.2.1CircuitryThecircuitrythroughwhichthesampleswillbebiasedmustbedesignedwithseveralconsiderations:2.1.1DeviceschematicThebiasingandoperatingschemesmustconsiderthelimitationsofthedeviceandshallnotoverstressthedevicesorcontributetothermalrunaway.2.1.2PowerThetestcircuitshouldbedesignedtolimitpowerdissipationsuchthat,ifadevicefailureoccurs,excessivepowerwillnotbeappliedtootherdevicesinthesample.2.2DevicemountingEquipmentdesign,ifrequired,shallprovideformountingofdevicestominimizeadverseeffectswhilepartsareunderstress,(e.g.,improperheatdissipation).JESD22-A108-BPage2TestMethodA108-B(RevisionofTestMethodA108-A)2Apparatus(cont’d)2.3PowersuppliesandsignalsourcesInstruments(suchasDVMs,oscilloscopes,etc.)usedtosetupandmonitorpowersuppliesandsignalsourcesshallbecalibratedandhavegoodlong-termstability.2.4EnvironmentalchamberTheenvironmentalchambershallbecapableofmaintainingthespecifiedtemperaturewithinatoleranceof±5°Cthroughoutthechamberwhilepartsareloadedandunpowered.3Definitions3.1MaximumoperatingvoltageThemaximumsupplyvoltageatwhichadeviceisspecifiedtooperateincompliancewiththeapplicabledevicespecificationordatasheet.3.2AbsolutemaximumratedvoltageThemaximumvoltagethatmaybeappliedtoadevice,beyondwhichdamage(latentorotherwise)mayoccur;itisfrequentlyspecifiedbydevicemanufacturersforaspecificdeviceand/ortechnology.3.3AbsolutemaximumratedjunctiontemperatureThemaximumjunctiontemperatureofanoperatingdevice,beyondwhichdamage(latentorotherwise)mayoccur;itisfrequentlyspecifiedbydevicemanufacturersforaspecificdeviceand/ortechnology.NOTEManufacturersmayalsospecifymaximumcasetemperaturesforspecificpackages.4ProcedureThesampledevicesshallbesubjectedtothespe