EIA-364-06B-2000---TP-06B-Contact-Resistance-Test-

EIASTANDARDTP-06BContactResistanceTestProcedureforElectricalConnectorsEIA-364-06B(RevisionofEIA-364-06A)MAY2000ELECTRONICCOMPONENTS,ASSEMBLIES&MATERIALSASSOCIATIONTHEELECTRONICCOMPONENTSECTOROFTHEELECTRONICINDUSTRIESALLIANCEEIA-364-06BANSI/EIA-364-06B-2000Approved:May5,2000NOTICEEIAEngineeringStandardsandPublicationsaredesignedtoservethepublicinterestthrougheliminatingmisunderstandingsbetweenmanufacturersandpurchasers,facilitatinginterchangeabilityandimprovementofproducts,andassistingthepurchaserinselectingandobtainingwithminimumdelaytheproperproductforhisparticularneed.ExistenceofsuchStandardsandPublicationsshallnotinanyrespectprecludeanymemberornonmemberofEIAfrommanufacturingorsellingproductsnotconformingtosuchStandardsandPublications,norshalltheexistenceofsuchStandardsandPublicationsprecludetheirvoluntaryusebythoseotherthanEIAmembers,whetherthestandardistobeusedeitherdomesticallyorinternationally.StandardsandPublicationsareadoptedbyEIAinaccordancewiththeAmericanNationalStandardsInstitute(ANSI)patentpolicy.Bysuchaction,EIAdoesnotassumeanyliabilitytoanypatentowner,nordoesitassumeanyobligationwhatevertopartiesadoptingtheStandardorPublication.ThisStandardisbaseduponthemajortechnicalcontentofInternationalElectrotechnicalCommissionstandard512-2,test2b,contactresistance–specifiedtestcurrentmethod,1985,secondedition.ItconformsinallessentialrespectstothisIECstandard.ThisStandarddoesnotpurporttoaddressallsafetyproblemsassociatedwithitsuseorallapplicableregulatoryrequirements.ItistheresponsibilityoftheuserofthisStandardtoestablishappropriatesafetyandhealthpracticesandtodeterminetheapplicabilityofregulatorylimitationsbeforeitsuse.(FromStandardsProposalNo.4729,formulatedunderthecognizanceoftheCE-2.0NationalConnectorStandardsCommittee.)PublishedbyELECTRONICINDUSTRIESALLIANCE2000TechnologyStrategy&StandardsDepartment2500WilsonBoulevardArlington,VA22201PRICE:PleaserefertothecurrentCatalogofEIAElectronicIndustriesAllianceStandardsandEngineeringPublicationsorcallGlobalEngineeringDocuments,USAandCanada(1-800-854-7179)International(303-397-7956)AllrightsreservedPrintedinU.S.A.PLEASE!DON”TVIOLATETHELAW!ThisdocumentiscopyrightedbytheEIAandmaynotbereproducedwithoutpermission.Organizationsmayobtainpermissiontoreproducealimitednumberofcopiesthroughenteringintoalicenseagreement.Forinformation,contact:GlobalEngineeringDocuments15InvernessWayEastEnglewood,CO80112-5704orcallU.S.A.andCanada1-800-854-7179,International(303)397-7956iCONTENTSClausePage1Introduction..............................................................................................................11.1Scope........................................................................................................................12Testresources...........................................................................................................12.1Equipment................................................................................................................13Testspecimen...........................................................................................................13.1Description...............................................................................................................13.2Preparation...............................................................................................................24Testprocedure..........................................................................................................25Detailstobespecified..............................................................................................36Testdocumentation..................................................................................................3Figure1Testcircuit................................................................................................................4ii(Thispageleftblank)EIA-364-06BPage1TESTPROCEDURENo.06BCONTACTRESISTANCETESTPROCEDUREFORELECTRICALCONNECTORS(FromEIAStandardsProposalNo.4729,formulatedunderthecognizanceEIACE-2.0CommitteeonNationalConnectorStandards,andpreviouslypublishedinEIA-364-06A.)1Introduction1.1ScopeThisstandardestablishestestmethodstodeterminetheresistanceofmatedconnectorcontactsattachedtolengthsofwirebymeasuringthevoltagedropacrossthecontactswhiletheyarecarryingaspecifiedcurrent.2Testresources2.1Equipment2.1.1Anammetercapableofmeasuringtheappliedcurrenttoanaccuracyof±2%.2.1.2Ahigh-impedancevoltmeter(intheorderof10,000ohmspervolt).Themeteraccuracyshallbesuchthatthevaluebeingmeasuredisaccurateto±2%.NOTEForgreatereaseofmeasuringforwardandreversereadings,azero-centerordigitalvoltmeterwithautomaticpolarityreversalisrecommended.2.1.3Asuitablecurrentsourcehavingacontrolledoutputasrequiredfortestcurrentsspecifiedinthereferencingdocument.Eitheracordcmaybeusedforthiscontactresistancetest.Foracmeasurements,thefrequencyshallnotexceed2kHz.Intheeventofadiscrepancybetweenacanddcmeasurements,thedcmethodshallbeemployed.2.1.4Anexampleofatestcircuitisshowninfigure1forthetestmethoddescribedin4.2thro