EIA-364-17B

EIASTANDARDTP-17BTemperatureLifewithorwithoutElectricalLoadTestProcedureforElectricalConnectorsandSocketsEIA-364-17B(RevisionofEIA-364-17A)JUNE1999ELECTRONICINDUSTRIESALLIANCEElectronicComponents,Assemblies,Equipment&SuppliesAssociationANSI/EIA-364-17B-1999Approved:April23,1999EIA-364-17BNOTICEEIAEngineeringStandardsandPublicationsaredesignedtoservethepublicinterestthrougheliminatingmisunderstandingsbetweenmanufacturersandpurchasers,facilitatinginterchangeabilityandimprovementofproducts,andassistingthepurchaserinselectingandobtainingwithminimumdelaytheproperproductforhisparticularneed.ExistenceofsuchStandardsandPublicationsshallnotinanyrespectprecludeanymemberornonmemberofEIAfrommanufacturingorsellingproductsnotconformingtosuchStandardsandPublications,norshalltheexistenceofsuchStandardsandPublicationsprecludetheirvoluntaryusebythoseotherthanEIAmembers,whetherthestandardistobeusedeitherdomesticallyorinternationally.StandardsandPublicationsareadoptedbyEIAinaccordancewiththeAmericanNationalStandardsInstitute(ANSI)patentpolicy.Bysuchaction,EIAdoesnotassumeanyliabilitytoanypatentowner,nordoesitassumeanyobligationwhatevertopartiesadoptingtheStandardorPublication.ThisstandardisbaseduponthemajortechnicalcontentofInternationalElectrotechnicalCommissionstandard512-5,Test9b,electricalloadandtemperature,1992-08.MethodBconformsinallessentialrespectstothisIECstandard.ThisStandarddoesnotpurporttoaddressallsafetyproblemsassociatedwithitsuseorallapplicableregulatoryrequirements.ItistheresponsibilityoftheuserofthisStandardtoestablishappropriatesafetyandhealthpracticesandtodeterminetheapplicabilityofregulatorylimitationsbeforeitsuse.(FromStandardsProposalNo.3752,formulatedunderthecognizanceoftheCE-2.0NationalConnectorStandardsCommittee.)Publishedby©ELECTRONICINDUSTRIESALLIANCE1999EngineeringDepartment2500WilsonBoulevardArlington,VA22201PRICE:PleaserefertothecurrentCatalogofEIA,ElectronicIndustriesAllianceStandardsandEngineeringPublicationsorcallGlobalEngineeringDocuments,USAandCanada(1-800-854-7179)International(303-397-7956)AllrightsreservedPrintedinU.S.A.!DON”TVIOLATETHELAW!ThisdocumentiscopyrightedbytheEIAandmaynotbereproducedwithoutpermission.Organizationsmayobtainpermissiontoreproducealimitednumberofcopiesthroughenteringintoalicenseagreement.Forinformation,contact:GlobalEngineeringDocuments15InvernessWayEastEnglewood,CO80112-5704orcallU.S.A.andCanada1-800-854-7179,International(303)397-7956iCONTENTSClausePage1Introduction..........................................................................................................11.1Scope...................................................................................................................11.2Atmosphericpressure...........................................................................................12Testresources......................................................................................................12.1Equipment............................................................................................................13Testspecimen.......................................................................................................13.1Preparation...........................................................................................................14Testprocedure......................................................................................................24.1MethodA,withoutelectricalload.........................................................................24.2MethodB,withelectricalloadforconnectors.......................................................24.3MethodC,withelectricalload..............................................................................34.4Testduration........................................................................................................44.5Examination..........................................................................................................55Detailstobespecified...........................................................................................56Testdocumentation..............................................................................................6Table1Testchambertemperaturewithoutelectricalload..................................................32Testchambertemperaturewithelectricalload.......................................................43Lengthoftest.......................................................................................................4(Thispageleftblank)EIA-364-17BPage1TESTPROCEDURENo.17BTEMPERATURELIFEWITHORWITHOUTELECTRICALLOADTESTPROCEDUREFORELECTRICALCONNECTORSANDSOCKETS(FromEIAStandardsProposalNo.3752,formulatedunderthecognizanceEIACE-2.0CommitteeonNationalConnectorStandards,andpreviouslypublishedinEIARecommendedStandardRS-364asTP-17A.)1Introduction1.1ScopeThisstandardestablishesatestmethodtodeterminetheabilityofanelectricalconnectorandsocketstowithstandelevatedtemperatureswithorwit