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ISO106052008-07-15Roadvehicles—TestmethodsforelectricaldisturbancesfromelectrostaticdischargeISO21234566.16.26.36.46.56.677.17.27.388.18.28.38.499.19.29.31010.110.210.311ABCFPSCDEF3ISO106052008E1(ESD)(DUT)/)IEC61000-4-22()ISO7637-1--1ISO11452-1--13.ISO7637-1ISO11452–13.13.23.3DUT3.43.5ESD3.6ESD3.7GRP3.810%3.9HCP43.103.113.124.C—20±10—20%60%2030%5.ESD,6.6.111—2kV15kVa2kV25kVa≤5%10%90%0.7ns1ns≥5s150pF330pF330Ω2000ΩaC//102m3m6.26.2.115116.2.22115kV20mm30mm26.36.3.1A22//A/kV%t1/A/kV%t2/A/kV%150pF/330Ω3.75±102(t1=30ns)±301(t2=60ns)±30330pF/330Ω3.75±102(t1=65ns)±301(t2=130ns)±30150pF/2000Ω3.753000.275(t1=180ns)±300.15(t2=360ns)±30330pF/20000Ω3.753000.275(t1=400ns)±300.15(t2=800ns)±3012A.1A.2B330ns60ns65ns130ns180ns360ns400ns800nsRC40t120t2IEC61000-4-223a)3b)mmmm6XnsYA1330pF/3302150pF/330a)150pF/330330pF/3305kVXnsYA1330pF/20002150pF/2000a)150pF/2000330pF/20005kV36.3.2E6.4HCPGRP70.25mmHCP0.1m1.6m×0.8mHCPGRP0.7m1.0mGRPHCP6.51550±5mm206.6152mm3mm20mm25kV7.7.1D7.27.30.1m/s0.5m/s88.1—8.3—HCP8.4F330pF150pF10.1330Ω330pF12A88.2————8.38.3.1F8.3.2HCP4HCPHCP6.61.50m2.50m0.2mHCPHCP0.1m6.5HCPHCP40.1mHCP0.2m9192103114125HCP13470k614GRP715HCP848.3.38.3.3.118.3.3.227.38.3.445°8.3.5(C)31s—≥1MΩ10——“”8.3.6C8.48.4.1HCPHCPHCPHCP0.1mHCPHCP0.1mF8.4.2HCP5HCPHCP6.61.50m2.50m0.2mHCPHCP0.1m6.5HCPHCPGRP50.1mHCP0.2m11192103114125HCP13470k614GRP715HCP816HCPGRP58.4.3C50HCP50ms8.4.4HCPHCP8.4.5C99.1A150pF9.212————9.39.3.1/0.5mm22mm225mm0.5mm22mm225mm9.3.26672470kΩ45HCP107Ω109Ω(/)HCP6.0.1mHCP0.2m0.2m9.3.39.3.3.119.3.3.227.31315HCP26374869.3.445°9.3.5(C)31s—≥1MΩ——“”9.3.6CC1010.1330pF330Ω2kΩ1415kV150pF330Ω2kΩ25kV15kV25kVA1210.2————10.310.3.1/10.3.27a7b10.3.310.3.3.1110.3.3.227.310.3.445°10.3.5(C)1531s—≥1MΩ——“”10.3.6C10.3.71234a)161234b)71117AA.1—2.1Ω12.1Ω2BA.2A.2.1A.2.2—1GHz——25kV5%—1.2m×1.2m0.6m—A.2.3A.2.3.1A.1A.2.3.2——4A.2.3.31.2m×1.2m(A.1)0.5mA.2.3.4—IpA—I1t1A(2)I2t2A(2)—trnsXXXX.Ip18A.2.3.51.2m×1.2m≤10%A.1330Ω2kΩ150pF330pF150pF330pF1010IpI1I2trIpI1I2trt1/A/kVt2/A/kV/A/kV191GRP23GRP45678A.1mm20BB.1B.B.5A1mGR4006dBB.1B.5a)mm21b)12590°c)B.1mmmm2212590°—0805—15Ω——0,5mmFR4—a)13.3mm2b)B.2—23a)PTFEb)c)mmmmmm24d)PTFEe)PTFEmmmm251Nf)A—SMAB.3mm26a)b)B.4—mmmm271PTFE2345PTFE67SMA8B.528B.2B.2.1———1GHz±0.5dB1FFT21%——B.2.2B.650dDB.7501GHz50±2%1GHz30dB1GHz±0.3dB12B.629123dDB.7B.2.3——B.820dB—30123504A5B67aB.8——B.81———B.8———1GHz±0.5dB231%——B.2.4————50B.9IsysVoscZsys311234567508B.9———Isys1A±1%50ΩV—B.10.5%——B.132CFPSCC.1/a)b)c)C.2FPSCa)b)C.3FPSCC.3.1FPSCC.3.2C.3.3C.3.212a)b)c)/33d)C.3.3C.4FPSCC.4.1FPSCC.1C.1a)No.1(I)L1b)No.2L1c)No.3L2No.4No.3No.2No.2C.1C.4.2C.1C.7C.1123L4i±8kV±8kV±15kVL3i±6kV±8kV±8kVL2i±4kV±4kV±6kVL1i±2kV±2kV±4kVC.2123L4i±15kV±15kV±25kVL3i±8kV±8kV±15kVL2i±4kV±6kV±8kVL4iL3iL2iL1i34L1i±2kV±4kV±6kVC.3123L4i±8kV±15kV±20kVL3i±6kV±8kV±15kVL2i±4kV±4kV±8kVL1i±2kV±2kV±4kVC.4123L4i±6kV±8kV±8kVL3i±4kV±4kV±6kVL2i±2kV±2kV±2kVL1iC.5123L4i±8kV±15kV±15kVL3i±6kV±8kV±8kVL2i±4kV±4kV±6kVL1i±2kV±2kV±4kVC.6123L4i±6kV±8kV±8kVL3i±4kV±6kV±6kVL2i±2kV±2kV±4kVL1i±2kVC.7123L4i±15kV±15kV±25kVL3i±8kV±8kV±15kVL2i±4kV±6kV±8kVL1i±2kV±4kV±6kV35DD.12k3303302kD.2D.3D.5D.3D.3.1D.3.2D.3.3D.4D.4.1D.4.236D.4.3D.5D.5.1D.5.2D.5.3D.5.4D.3D.437EE.1D.3ANSIC63.16a)b)E.2a)0Ω0b)500V1.5GHz500Vc)20V/sPaschen0.2mm38FF.18F.2/F.3F.1F.2F.3391.10mm160mm×350mm2.40mm3.—80mm4.εr2,550mm)0.5mm2mm±5%F.1401.2.3.4.5.6.7.8.9.10.11.12.13.2470k14.15.±5%F.2411.2.3.4.5.6.7.8.9.10.11.12.13.2470k14.15.±5%F.3HCP0.52×470kΩF.2F.3HCP36.1F.2F.33421700(3000)mm10mmF.2F.31010mm310F.2F.3F.2F.33HCPF.2F.310200mmF.4F.4.1/F.4.2—2330pF330Ω150pF330ΩC.4C.410101MΩ2470kΩ2sF.4.3—F.3330pF330Ω1040180°432sF.4.4C.4[1]IEC61000-4-2,Electromagneticcompatibility(EMC)—Part4-2:Testingandmeasurementtechniques—Electrostaticdischargeimmunitytest[2]ANSIC63.16-1993,Guideforelectrostaticdischargetestmethodologiesandcriteriaforelectronicequipment[3]FREI,S.andPOMMERENKE,D.,“AnAnalysisoftheFieldsontheHorizontalCouplingPlaneinESDTesting”,1997EOS/ESDSymposium,pp.99-106[4]MAAS,J.,RHOADES,W.,“TheANSIESDStandardOvercomingtheDeficienciesofWorld-WideESDStandards”,IEEEInt.Symp.onEMC,1998,pp.1078-1084[5]DAOUT,B.,RYSER,H.,“TheCorrelationofRisingSlopeandSpeedofApproachinESDTests”,12thInternationalZurichSymposiumonEMC,1987[6]FREI,S.,SENGHAAS,M.,JOBAVA,R.,KALKNER,W.,“TheInfluenceofSpeedofApproachandHumidityontheIntensityofESD”,InternationalZurichSymposiumonElectromagneticCompatibility,1999