MOSFET分析资料

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©2010MOS-TECHSemiconductorCorporation:“Standard”,“HighQuality”,and“Specific”.TherecommendedapplicationsforeachMos-TechElectronicsproductdependsontheproduct’squalitygrade,asindicatedbelow.YoumustcheckthequalitygradeofeachMos-TechElectronicsproductbeforeusingitinaparticularapplication.YoumaynotuseanyMos-TechElectronicsproductforanyapplicationcategorizedas“Specific”withoutthepriorwrittenconsentofMos-TechElectronics.Further,youmaynotuseanyMos-TechElectronicsproductforanyapplicationforwhichitisnotintendedwithoutthepriorwrittenconsentofMos-TechElectronics.Mos-TechElectronicsshallnotbeinanywayliableforanydamagesorlossesincurredbyyouorthirdpartiesarisingfromtheuseofanyMos-TechElectronicsproductforanapplicationcategorizedas“Specific”orforwhichtheproductisnotintendedwhereyouhavefailedtoobtainthepriorwrittenconsentofMos-TechElectronics.ThequalitygradeofeachMos-TechElectronicsproductis“Standard”unlessotherwiseexpresslyspecifiedinaMos-TechElectronicsdatasheetsordatabooks,etc.“Standard”:Computers;officeequipment;communicationsequipment;testandmeasurementequipment;audioandvisualequipment;homeelectronicappliances;machinetools;personalelectronicequipment;andindustrialrobots.“HighQuality”:Transportationequipment(automobiles,trains,ships,etc.);trafficcontrolsystems;anti-disastersystems;anti-crimesystems;safetyequipment;andmedicalequipmentnotspecificallydesignedforlifesupport.“Specific”:Aircraft;aerospaceequipment;submersiblerepeaters;nuclearreactorcontrolsystems;medicalequipmentorsystemsforlifesupport(e.g.artificiallifesupportdevicesorsystems),surgicalimplantations,orhealthcareintervention(e.g.excision,etc.),andanyotherapplicationsorpurposesthatposeadirectthreattohumanlife.8.YoushouldusetheMos-TechElectronicsproductsdescribedinthisdocumentwithintherangespecifiedbyMos-TechElectronics,especiallywithrespecttothemaximumrating,operatingsupplyvoltagerange,movementpowervoltagerange,heatradiationcharacteristics,installationandotherproductcharacteristics.Mos-TechElectronicsshallhavenoliabilityformalfunctionsordamagesarisingoutoftheuseofMos-TechElectronicsproductsbeyondsuchspecifiedranges.9.AlthoughMos-TechElectronicsendeavorstoimprovethequalityandreliabilityofitsproducts,semiconductorproductshavespecificcharacteristicssuchastheoccurrenceoffailureatacertainrateandmalfunctionsundercertainuseconditions.Further,Mos-TechElectronicsproductsarenotsubjecttoradiationresistancedesign.Pleasebesuretoimplementsafetymeasurestoguardthemagainstthepossibilityofphysicalinjury,andinjuryordamagecausedbyfireintheeventofthefailureofaMos-TechElectronicsproduct,suchassafetydesignforhardwareandsoftwareincludingbutnotlimitedtoredundancy,firecontrolandmalfunctionprevention,appropriatetreatmentforagingdegradationoranyotherappropriatem

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