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31,2,2,1,2,2(1.,710071;2.,100854):(1.06m),,BRDFPowell:;;;:O436.2:A:100722276(2004)0520549204Researchonlightscatteringcharacteristicsofroughsurfaceandopticalconstantsdeduction3WANGMing2jun1,2,DONGYan2bing2,WUZhen2sen1,DENGRong2,WANGYun2qiang2(1.SchoolofScience,XidianUniversity,Xian710071,China;2.OpticalSignatureofTargetsandEnvironmentsKeyLaboratoryofNationalDefenceScienceandTechnology,Beijing100854,China)Abstract:TheLBRDF(1.06m),equivalentopticalconstantdispersion,specularreflectivityspectrumandtotalhemispherereflectivityspectrumofgildedfilm,platingaluminousadiabaticmaterialandsiliciccom2poundforroughsurfacesaremeasured.Themethodsofspecularreflectiveintensityareutilizedtocalculatetherootmeansquareofthegildedfilmandadiabaticmaterialsurfaceroughness.BasedonmeasureddataofLBRDF,thepoly2parametergeneticoptimizedalgorithmsareutilizedtocreatestatisticalBRDFmodelofabove2mentionedmaterial.Accordingtotheellipsometrymeasuringtheopticalconstants,thePowelloptimummethodisusedtodeducethesedatawithcertainwavelengthforadiabaticmaterialindifferentwaveband.Keywords:Roughsurface;BRDF;Hemispherereflectivityspectrum;Equivalentopticalconstant:2003211208;:20032122013:863(2002AA731190):(19792),,,,335200410Vol.33No.5InfraredandLaserEngineeringOct.2004©1995-2006TsinghuaTongfangOpticalDiscCo.,Ltd.Allrightsreserved.0[1,2][3,4],[5,6],,(BRDF),BRDF,,,1,,BRDF:BRDFsBRDFr=Vs(i,i;r,r)Vr(i,i;r,r)(1)BRDFsBRDF;Vr(i,i;r,r);Vs(i,i;r,r),1.06m95.4%,0/,0(1):Rs=fr(i,i;r,r)cosr=Vs(i,i;r,r)Vr(0,0;0,0)0cosr(2)12i0153045,0,i15304560,r0,,(),(),,;,V2570,1nm453,WT,WS,AT,AS305533©1995-2006TsinghuaTongfangOpticalDiscCo.,Ltd.Allrightsreserved.,,,,3Fig.3Experimentalresultsofreflectivityspectrumforplatingaluminousa2diabaticmaterialandgildedfilm4,[7](WM)(AM),/4,,,,4Fig.4TherootmeansquareforplatingaluminousadiabaticmaterialandgildedfilmBRDF[8],:Rs(i,r,0)=aexp[-b(i-r)2]+dcosrcosci(3)();,a=10.30099,b=98,c=1,d=0.0799,E=0.75%;,a=10.2899,b=98,c=1,d=0.0799,E=0.54%5i0r0i15r15,5ATMAE,WTMWE5BRDFFig.5Comparisonoftheoreticalandexperimentalresultsofplatingalumi2nousadiabaticmaterialandgildedfilm26SentechInstrumentsM22000UI,0.01,WM,SB1Powell[9]Powell,,Drude[10],B,CPowell1555:©1995-2006TsinghuaTongfangOpticalDiscCo.,Ltd.Allrightsreserved.6Fig.6Measuringrealandimaginarypartionofopticalconstantofplatingaluminousadiabaticmaterialandsiliciccompound,,,,,1B,CPowell1Tab.1Comparisonofexperimentalmeasurmentanddeductionresultsofopticalconstantswithcer2tainwavelengthindifferentwavebandTheopticalconstantsofplatingaluminousadiabaticmaterialExperimentalresultTheoreticalresultExperimentalresultTheoreticalresultExperimentalresultTheoreticalresultBand/m0.250.500.600.800.901.80B/m9913399.8C/m0.6080.6480.7985/m0.3600.6301.06n0.399750.39681.36311.25821.22782.015k4.37514.22597.5987.598810.37710.331831.06m,,,,,,,,Powell,,,,,,,,:[1],,.[M].:,1995.1282144.[2],,,.[J].(),1991,1722177.[3],,,.[J].,2001,30(6):4062409.[4],,,.[J].,1999,28(3):55258.[5]WuZhensen.IRlaserbackscatteringbyarbitrarilyshapeddielectricob2jectwithroughface[J].JournalofElectronics,1993,10(4):2982306.[6]TomiyaasuK.Relationshipbetweenandmeasurementofdiffractionscat2teringcoefficientandbi2directionalreflectancedistributionfunction(BRDF)[J].IEEE,1998,GE226(5):6602665.[7]UlabyFT,MooreRK,FungAK.Microwaveremotesensing.Vol.2[M].Massachusetts:Addison2Wesleypublishingcompany,1982.9222991.[8]WuZhensen,XieDonghui,WeiQinlong,etal.Modelingreflectancefunctionfromroughsurfaceandalgorithm[J].ActaOpticaSinica,2002,22(8):8972901.[9],,.[J].,1995,24(2):17222.[10]VorburgerTV,LudemaKC.Ellipsometryofroughsurfaces[J].Ap2pliedOptics,1980,19(4):5612573.25533©1995-2006TsinghuaTongfangOpticalDiscCo.,Ltd.Allrightsreserved.