能谱技术

Scanningtunnelingmicroscopy&spectroscopy(STM/STS)SIMSISS能谱技术发光光谱与吸收光谱光致发光谱(PL)光致发光激发谱（PLE）光致发光淬灭谱（PLQ）电致发光谱（EL），阴极荧光谱（CL）红外光谱拉曼光谱布里渊散射磁学、超导和低温技术核磁共振：NMR电子顺磁共振：EPR或ESRSQUID低温实现和测量核物理方法RBS正电子湮没穆斯堡尔谱高压技术高压产生和测量高压物理实验方法高温高压材料合成方法能谱技术能谱技术：XPS,UPS,AES,EELS光电效应能谱技术能谱技术：XPS,UPS,AES,EELS分析器：筒镜分析器CMA球偏转分析器SDA柱偏转分析器平面镜分析器PMA带通减速场分析器X-射线源UVsourcesXPSAESPEEM&LEEMSampleImagingDeviceObjectivelensContrastapertureStigmator/DeflectorFirstProjectivelensMultiChannelPlateFluorescentScreenIrisApertureSecondProjectivelensGmbHDoubleGridSystemRetardLensImagingEnergyFilterTheSPELEEMSpectroscopicPhotoemissionandLowEnergyElectronMicoscope•PEEMwithfullspectromicroscopiccapabilities•PEEMwithmagneticsectorfieldincombinationwithMEMandLEEM•Noaberrationcorrectionyet•Modesofoperation:–ImagingXPEEM(spectromicroscopy)–Dispersiveplane(microspectroscopy)–Diffractionmode(PED)TheSPELEEMSpectroscopicphotoemissionandlowenergyelectronmicroscopeTheSPELEEMatELETTRATheenergyfilterR=100mmPassEnergy=900VModesofOperationXPEEMLEEMPESELSPEDLEEDARPESEELSEDSWDSSTM/STSScanningtunnelingmicroscopy&spectroscopy(STM/STS)