JESD74A

JEDECSTANDARDEarlyLifeFailureRateCalculationProcedureforSemiconductorComponentsJESD74A(RevisionofJESD74,April2000)FEBRUARY2007JEDECSolidStateTechnologyAssociationNOTICEJEDECstandardsandpublicationscontainmaterialthathasbeenprepared,reviewed,andapprovedthroughtheJEDECBoardofDirectorslevelandsubsequentlyreviewedandapprovedbytheJEDEClegalcounsel.JEDECstandardsandpublicationsaredesignedtoservethepublicinterestthrougheliminatingmisunderstandingsbetweenmanufacturersandpurchasers,facilitatinginterchangeabilityandimprovementofproducts,andassistingthepurchaserinselectingandobtainingwithminimumdelaytheproperproductforusebythoseotherthanJEDECmembers,whetherthestandardistobeusedeitherdomesticallyorinternationally.JEDECstandardsandpublicationsareadoptedwithoutregardtowhetherornottheiradoptionmayinvolvepatentsorarticles,materials,orprocesses.BysuchactionJEDECdoesnotassumeanyliabilitytoanypatentowner,nordoesitassumeanyobligationwhatevertopartiesadoptingtheJEDECstandardsorpublications.TheinformationincludedinJEDECstandardsandpublicationsrepresentsasoundapproachtoproductspecificationandapplication,principallyfromthesolidstatedevicemanufacturerviewpoint.WithintheJEDECorganizationthereareprocedureswherebyaJEDECstandardorpublicationmaybefurtherprocessedandultimatelybecomeanANSIstandard.Noclaimstobeinconformancewiththisstandardmaybemadeunlessallrequirementsstatedinthestandardaremet.Inquiries,comments,andsuggestionsrelativetothecontentofthisJEDECstandardorpublicationshouldbeaddressedtoJEDECattheaddressbelow,orcall(703)907-7559or©JEDECSolidStateTechnologyAssociation20052500WilsonBoulevardArlington,VA22201-3834Thisdocumentmaybedownloadedfreeofcharge;howeverJEDECretainsthecopyrightonthismaterial.Bydownloadingthisfiletheindividualagreesnottochargefororreselltheresultingmaterial.PRICE:PleaserefertothecurrentCatalogofJEDECEngineeringStandardsandPublicationsonlineat!DON’TVIOLATETHELAW!ThisdocumentiscopyrightedbyJEDECandmaynotbereproducedwithoutpermission.Organizationsmayobtainpermissiontoreproducealimitednumberofcopiesthroughenteringintoalicenseagreement.Forinformation,contact:JEDECSolidStateTechnologyAssociation2500WilsonBoulevardArlington,Virginia22201-3834orcall(703)907-7559JEDECStandardNo.74A-i-EARLYLIFEFAILURERATECALCULATIONPROCEDUREFORSEMICONDUCTORCOMPONENTSContentsPageIntroductionii1Scope12Referencedocuments13Termsanddefinitions24Generalrequirements44.1Testsamples44.2Testconditions44.3Testdurations44.4Failureanalysis45CalculationELFR55.1Exponentialdistribution(constantfailurerate)85.1.1Exponentialdistribution,singleELFtest85.1.1.1Exponentialdistribution–1failuremechanism,singleELFtest95.1.1.2Exponentialdistribution–2failuremechanisms,singleELFtest95.1.2Exponentialdistribution–1failuremechanism,multipleELFtests95.1.2.1Exponentialdistribution–1failuremechanism,multipleELFtests105.1.3Exponentialdistribution–multiplefailuremechanisms,multipleELFtests105.1.3.1Exponentialdistribution–2failuremechanisms,multipleELFtests105.2Decreasingfailurerate105.2.1Decreasingfailurerate,singleELFtest115.2.1.1Decreasingfailurerate–1failuremechanism,singleELFtest135.2.1.2Decreasingfailurerate–2failuremechanisms,singleELFtest145.2.2Decreasingfailurerate–1failuremechanism,multipleELFtests145.2.2.1Decreasingfailurerate–1failuremechanism,multipleELFtests155.2.3Decreasingfailurerate–multiplefailuremechanisms,multipleELFtests155.2.3.1Decreasingfailurerate–2failuremechanisms,multipleELFtests155.3AlternateELFRcalculationformultiplefailuremechanisms16AnnexA–Exampleusingtheexponentialdistributionwith1failuremechanismandasingleELFtest17AnnexB–Exampleusingtheexponentialdistributionwith2failuremechanismsandasingleELFtest18AnnexC–Exampleusingtheexponentialdistributionwith1failuremechanismand3ELFtests20AnnexD–Exampleusingtheexponentialdistributionwith2failuremechanismsand3ELFtests21AnnexE–ExampleusingaWeibulldistributionwithdecreasingratewith1failuremechanismandasingleELFtest23AnnexF–ExampleusingtheWeibulldistributionwith2failuremechanismsandasingleELFtest24AnnexG–ExampleusingaWeibulldistributionwithdecreasingratedistributionwith1failuremechanismand3ELFtests26AnnexH–ExampleusingaWeibulldistributionwithdecreasingratewith2failuremechanismsand3ELFtests27AnnexJ–ChiSquarevaluestable29AnnexK–(informative)DifferencesbetweenJESD74AandJESD7430Figures5.1Reliabilitybathtubcurve55.2Cumulativefailuresversusstresstime11TablesJ.1Squaredistribution,χ2valuesatvariousconfidencelevels29JEDECStandardNo.74A-ii-EARLYLIFEFAILURERATECALCULATIONPROCEDUREFORSEMICONDUCTORCOMPONENTSIntroductionEarlylifefailurerate(ELFR)measurementofaproductistypicallyperformedduringproductqualificationsoraspartofongoingproductreliabilitymonitoringactivities.Thesetestsmeasurereliabilityperformanceovertheproduct’sfirstseveralmonthsinthefield.Itisthereforeimportanttoestablishamethodologythatwillaccuratelyprojectearlylifefailureratetoactualcustomeruseconditions.JEDECStandardNo.74APage1EARLYLIFEFAILURERATECALCUL