连接器可靠性测试报告精华表单

ABCDEFGHIJKL1,71,71,51,51,32,62,42,42,53,624433,53PassPassPassPassPassPassPassPassPassPassPassPassP2P3P4P5P6P7P8P9P10P11P12P13報告編號FileNo.測試環境Environment25±1℃65±5RH(%)送檢單位RequestDept.測試期間TestDuration可靠性測試報告ReliabilityTestReportWhentestasspecified,thesubmittedsamplescomplywiththestatedrequirementoftheproductspecification.按指定規范對送檢樣品進行測試，樣品符合產品規格要求。ReferringtoEIA-364testprocedureandtheHDMISpecification參照EIA-364電子連接器測試程序和HDMI規范樣品料號PartNo.樣品名稱SampleName客戶名稱Customer送樣數量SampleQ'ty.DurabilityHumidityThemalShock內容ContentReferringtothetestequipmentlist請參照《測試設備明細》測試群組和順序TestGroup&SequenceAppliedVoltageRating測試記錄TestrecordSaltSprayMatingandUnmatingForceTemperatureLifeResistancetoSolderContactRetentionVisualInspectionLowLevelContactResistanceInsulationResistanceDielectricWithstandingVoltageSolderability測試項目TestItem每組5個樣品5pcsSample/group樣品來源SampleFrom樣品描述SampleDescription測試設備TestEquipment測試標準TestMethod審核Checkedby檢測InspectedbyContactCurrentRating測試結果TestResultPASS核准Approvedby測試結論Conclusion備注NotePage1/kgf.Maxkgf.Minkgf.Maxkgf.MinmΩMax.mΩMax.4mmCycles4.23PinNo.1st2nd3rd4th5th6th7th8th9th10th11th12th13th14th15th16th17th18th19thShellInitialFinal|△R|InitialFinal|△R|InitialFinal|△R|InitialFinal|△R|InitialFinal|△R|JudgmentPass群組A測試記錄TestRecordofGroupA測試項目TestItem測試結論Conclusion備注NoteSampleNo.接觸阻抗測試數據（單位：毫歐）ContactResistanceTestData(unit:mΩ)判定Judgment1#測試數據TestData樣號SampleNo.5次拔出力5TimesUnmatingForce(unit:kgf.)判定Judgment插拔力測試和耐插拔測試MatingandUnmatingForceTest&DurabilityTestcycles/hour100對插深度DepthofMating測試次數Cycles10,000測試標準TestMethod參照EIA-364-13、EIA-364-09電子連接器測試程序ReferringtoEIA-364-13andEIA-364-09testprocedure判定標準JudgmentMethod初始插入力InitialMatingForce耐久插拔后插入力FinalMatingForceafterTest2#3#InitialMatingForce外殼接觸阻抗變化值|△|C.R.ofShellFinalMatingForce5次插入力5TimesMatingForce(unit:kgf.)1#2#測試條件TestCondition接點測試電壓TestVoltagesforContact接點測試電流TestCurrentforContact外殼測試電壓TestVoltagesforShell循環速率RateofCycling5#3#4#5#VisualInspection505050InitialUmatingForceFinalUmatingForce端子接觸阻抗變化值|△|C.R.ofContact4.5430初始拔出力InitialUmatingForce耐久插拔后拔出力FinalUmatingForceafterTest4#外殼測試電流TestCurrentforShell20mVoltsMax.5mA5VoltsMax.100mAP2MΩMin.MΩMin.mΩMax.mΩMax.VDC~~PinNo.1st2nd3rd4th5th6th7th8th9th10th11th12th13th14th15th16th17th18th19thShellInitialFinal|△R|InitialFinal|△R|InitialFinal|△R|InitialFinal|△R|InitialFinal|△R|Judgment1#2#3#4#5#1#2#3#4#5#PassJudgmentPass判定標準JudgmentMethod未對插狀態連接器I.R.ofUnmatedConnector100對插狀態連接器I.R.ofMatedConnector10沒有閃光、火花和擊穿現象，漏電流小于5毫安為合格。Noevidenceofflashoverorsparkover,breakdownorleakagecurrentinexcessofthemaximum5mA.群組B測試記錄TestRecordofGroupB測試項目TestItem絕緣測試、耐電壓測試和溫濕測試InsulationResistantTest,DielectricWithstandingVoltageTest&HumidityTest測試標準TestMethod參照EIA-364-21、EIA-364-20和EIA-364-31電子連接器測試程序ReferringtoEIA-364-21,EIA-364-20andEIA-364-31testprocedure試驗后絕緣阻抗Final(AfterHumiditytest)unit:MΩ100mA測試數據TestDataSampleNo.接觸阻抗測試數據（單位：毫歐）ContactResistanceTestData(unit:mΩ)判定Judgment1#2#3#4#20mVoltsMax.5mA5備注Note端子接觸阻抗變化值|△|C.R.ofContact30外殼接觸阻抗變化值|△|C.R.ofShell50InsulationResistance5#VisualInspection測試結論Conclusion初始絕緣阻抗（單位：兆歐）Inintialunit:MΩ測試條件forC.R.對插狀態連接器測試電壓TestVoltagesforMatedConnectors未對插狀態連接器測試電壓TestVoltagesforUnmatedConnectors接點測試電壓TestVoltagesforContact接點測試電流TestCurrentforContact外殼測試電壓TestVoltagesforShell外殼測試電流TestCurrentforShellVoltsMax.對插狀態連接器測試電壓TestVoltagesforMatedConnectorsforI.R.500150未對插狀態連接器測試電壓TestVoltagesforUnmatedConnectors500測試時間TestTimeforHumidity溫度Temperature25℃85℃300相對濕度(R.H.)forHi-pot80%95%測試期間Duration4cycles(96hours)VDCVACVAC測試時間TestTime6060sec.sec.P3mΩMax.mΩMax.PinNo.1st2nd3rd4th5th6th7th8th9th10th11th12th13th14th15th16th17th18th19thShellInitialFinal|△R|InitialFinal|△R|InitialFinal|△R|InitialFinal|△R|InitialFinal|△R|JudgmentPass群組C測試記錄TestRecordofGroupC測試項目TestItem鹽霧測試和接觸阻抗測試SaltSprayTest&ContactResistanceTest測試標準TestMethod參照EIA-364-23、EIA-364-26電子連接器測試程序ReferringtoEIA-364-23andEIA-364-26testprocedure測試結論Conclusion備注Note3#4#5#VisualInspection測試數據TestData2#SampleNo.接觸阻抗測試數據（單位：毫歐）ContactResistanceTestData(unit:mΩ)判定Judgment1#外殼接觸阻抗變化值|△|C.R.ofShell50判定標準JudgmentMethod鹽水PH值SolutionPHValue6.5~7.2噴霧壓力CompressedAirPressure1±0.01Kgf/cm2測試條件TestCondition飽和桶溫度Temp.ofSaturatorTower試驗倉溫度Temp.ofChamber端子接觸阻抗變化值|△|C.R.ofContact30鹽霧濃度NaClConcentration5%±1%試驗后清洗水溫度Temp.ofCleaningWater35℃駐留(試驗)時間TestDuration35±1℃12hours鹽霧收集量VolumeofCollectedSolution47±1℃1.0~2.0ml/h/80cm2mA5mA接點測試電壓TestVoltagesforContact接點測試電流TestCurrentforContact外殼測試電壓TestVoltagesforShellmVoltsMax.20VoltsMax.5100外殼測試電流TestCurrentforShellP4mΩMax.mΩMax.℃HoursPinNo.1st2nd3rd4th5th6th7th8th9th10th11th12th13th14th15th16th17th18th19thShellInitialFinal|△R|InitialFinal|△R|InitialFinal|△R|InitialFinal|△R|InitialFinal|△R|JudgmentPass測試條件TestCondition群組D測試記錄TestRecordofGroupD測試項目TestItem高溫壽命測試和接觸阻抗測試TemperatureLifeTest&ContactResistanceTest測試標準TestMethod參照EIA-364-17、EIA-364-26電子連接器測試程序ReferringtoEIA-364-17andEIA-364-26testprocedure判定標準JudgmentMethod端子接觸阻抗變化值|△|C.R.ofContact30外殼接觸阻抗變化值|△|C.R.ofShell504#接點測試電壓TestVoltagesforContact接點測試電流TestCurrentforContact外殼測試電壓TestVoltagesforShell外