标准Bellcore-SR332

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AnSAICCompanyReliabilityPredictionProcedureforElectronicEquipmentTelcordiaTechnologiesSpecialReportSR-332Issue1,May2001ReliabilityPredictionProcedureforElectronicEquipmentIssue1,May2001CopyrightPageSR-332iiReliabilityPredictionProcedureforElectronicEquipmentThisdocumentcompletelyreplacesTR-332,ReliabilityPredictionProcedureforElectronicEquipment,Issue6,December1997.Technicalcontact:JohnHealyTelcordiaTechnologies,Inc.331NewmanSpringsRoad,Room2X-227RedBank,NJ07701+1732.758.3065(phone)+1732.758.4060(fax)jhealy@telcordia.comToobtaincopiesofthisdocument,contactyourcompany’sdocumentcoordinatororyourTelcordiaaccountmanager,orcall+1800.521.2673(fromtheUSAandCanada)or+1732.699.5800(worldwide),orvisitourWebsiteat©2001TelcordiaTechnologies,Inc.Allrightsreserved.ProjectFundingYear:2001TrademarkAcknowledgmentsTelcordiaisatrademarkofTelcordiaTechnologies,Inc.Issue1,May2001ReliabilityPredictionProcedureforElectronicEquipmentSpecialReportNoticeOfDisclaimeriiiSR-332SpecialReportNoticeOfDisclaimerThisSpecialReportispublishedbyTelcordiaTechnologies,Inc.(Telcordia)toinformtheindustryoftheTelcordiaviewofaReliabilityPredictionProcedureforElectronicEquipment.Telcordiareservestherighttorevisethisdocumentforanyreason,includingbutnotlimitedto,conformitywithstandardspromulgatedbyvariousagencies,utilizationofadvancesinthestateofthetechnicalarts,orthereflectionofchangesinthedesignofanyequipment,techniques,orproceduresdescribedorreferredtoherein.TELCORDIAMAKESNOREPRESENTATIONORWARRANTY,EXPRESSORIMPLIED,WITHRESPECTTOTHESUFFICIENCY,ACCURACY,ORUTILITYOFANYINFORMATIONOROPINIONCONTAINEDHEREIN.TELCORDIAEXPRESSLYADVISESTHATANYUSEOFORRELIANCEUPONSAIDINFORMATIONOROPINIONISATTHERISKOFTHEUSERANDTHATTELCORDIACORESHALLNOTBELIABLEFORANYDAMAGEORINJURYINCURREDBYANYPERSONARISINGOUTOFTHESUFFICIENCY,ACCURACY,ORUTILITYOFANYINFORMATIONOROPINIONCONTAINEDHEREIN.Thisreportisnottobeconstruedasasuggestiontoanymanufacturertomodifyorchangeanyofitsproducts,nordoesthisdocumentrepresentanycommitmentbyTelcordiaoranyTelcordiaclienttopurchaseanyproduct,whetherornotitprovidesthedescribedcharacteristics.ReadersarespecificallyadvisedthateachTelcordiaclientmayhaverequirementsorspecificationsdifferentfromthegenericdescriptionsherein.Therefore,anyvendorsormanufacturersofproductsshouldcommunicatedirectlywithaTelcordiaClienttoascertainthatcompany’sneeds,specificationsandactualrequirements.Nothingcontainedhereinshallbeconstruedasconferringbyimplication,estoppelorotherwiseanylicenseorrightunderanypatent,whetherornottheuseofanyinformationhereinnecessarilyemploysaninventionofanyexistingorlaterissuedpatent.Telcordiadoesnotrecommendproductsandnothingcontainedhereinisintendedasarecommendationofanyproducttoanyone.Iffurthertechnicalinformationisrequired,pleasecontact:JohnHealyTelcordiaTechnologies,Inc.331NewmanSpringsRoad,Room2X-227RedBank,NJ07701+1732.758.3065(phone)+1732.758.4060(fax)jhealy@telcordia.comReliabilityPredictionProcedureforElectronicEquipmentIssue1,May2001SpecialReportNoticeOfDisclaimerivSR-332ForgeneralinformationaboutthisoranyotherTelcordiadocuments,pleasecontact:TelcordiaCustomerService8CorporatePlace,Room3A-184Piscataway,NJ08854-4156+1800.521.2673(USAandCanada)+1732.699.5800(worldwide)+1732.336.2559(FAX)–11.1PurposeandScope.................................1–11.2Changes........................................1–21.3StructureoftheReport...............................1–22.ReliabilityPredictionsforElectronicEquipment..................2–12.1PurposesofReliabilityPredictions........................2–12.2Equipment......................................2–22.3DefinitionofaFailure................................2–22.4FailureRates.....................................2–22.5FactorsAffectingFailureRates..........................2–42.6ChoiceofMethod..................................2–52.7FlowofCalculations.................................2–62.8ItemsExcludedfromFailureRateCalculations.................2–62.9InstructionsforDeviceTypes/TechnologiesNotinTable7-1..........2–62.10StatisticalConsiderations.............................2–72.11AutomatedReliabilityPredictionProcedure(ARPP)..............2–73.Steady-StateFailureRatePredictionforDevices.................3–13.1BlackBoxTechnique................................3–13.2TechniquesIntegratingLaboratoryData.....................3–23.2.1WhenLaboratoryTestDevicesHadNoPreviousBurn-in.........3–23.2.2WhenLaboratoryTestDevicesHadPreviousBurn-in...........3–23.3TechniquesIntegratingFieldData.........................3–33.3.1TotalOperatingHours............................3–43.3.2AdjustmentFactor(V)............................3–53.4Examples.......................................3–53.4.1Example1:BlackBoxTechnique......................3–53.4.2Example2:Inte

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