如何答复SCI论文审稿意见

DearReviewers:Wearetrulygratefultothecommentsandsuggestionsfromyourreview.Basedonthesecommentsandsuggestions,wehavemadecarefulmodificationsonthemanuscript.Allthechangesmadetothetextareinredcolor.Youwillfindourpointbypointresponsestothecommentsasbellow.ResponsestotheCommentsfromReviewer11.Comment:Mainconcernishowrobusttheresultsare.ItwouldbegoodtohavemoresamplesateachMoconcentrationandshowthattheobservedtrendasafunctionMoconcentrationisstatisticallysignificant.Response:Thanksforreviewer’scomment.MoresampleswithdifferentMoconcentration(x=0.2,0.3,0.4)wereprepared.Thepropertiesofthesamplesweremeasured,whichwereshowninthemaintextandsupplementarymaterial.2.Comment:ShouldalsocalculatetheFillFactor(FF)andcommentonwhytheFFissolowforthismaterial.Response:Thanksforreviewer’scomment.TheFillFactor(FF)wascalculated.ItisfoundthattheFFislowercomparedwiththatofthesemiconductorheterojunction.Thesimilarbehaviorsarealsoobservedinotherferroelectricphotovoltaicmaterials,duetothefactthatthedirectionofthephoto-generatedcurrentisoppositetothedirectionofthepolarization.Inthiswork,thedirectionofthephoto-generatedcurrentisconstantowingtothestableself-polarization.Whentheexternalvoltageisnegative,thedirectionofthephoto-generatedcurrentissamewiththedirectionoftheexternalelectricfield,leadingtoabigtotalcurrentinthesecondquadrant.Whentheexternalvoltageispositive,thedirectionofthephoto-generatedcurrentisoppositetothedirectionoftheexternalelectricfield,resultinginthatthetotalcurrentdecreasesgraduallywiththeincreaseofthevoltageinthefirstquadrant.Therefore,theFFislowinthismaterial.3.Comment:WhatistheSiO2thicknessbetweenSisubstrateandBFMNO?Response:Thanksforreviewer’scomment.Wefeelveryapologeticaboutthemistakeduetoamisidentificationforthelabelofthesubstratematerial.Inthework,theSiO2layerdoesnotexistinthesubstrate.ThesubstratejustconsistsofSi.Themanuscriptwasrevisedaccordingtothesubstratematerial.4.Comment:NeedtoincludeGoldfabricationdetails.Response:Thanksforreviewer’scomment.Thegoldelectrodeswerefabricatedbysputteringmethodusingavacuumionsputteringequipment.TheexperimentaldetailswereaddedintheMaterialandmethods.5.Comment:WasthereanypolarizationtreatmentbeforePVcharacterization?Needtoclarifyinthetext.Response:Thanksforreviewer’scomment.Inthiswork,thefilmswerenotpolarizedbeforethemeasurementofthePVproperties.Itjustshowsthatthefilmshaveaself-polarizationbehavior.Theexpatiationwasaddedintherevisedmanuscript.6.Comment:NeedP-Ehysteresisloopforx=0.75.Iwouldrecommendtoincludeallx=0.75resultsinmaintextforacompletepictureofhowthepropertiesevolveasMoconcentrationincreases.Response:Thanksforreviewer’scomment.Thepropertiesofthefilmwithx=0.75weremeasured,whichwereaddedinthemaintext.Basedontheresults,itisfoundthatthebandgapofx=0.75increasesandthePVpropertiesdegenerate,indicatingthatthePVperformancesdecreaseasMoconcentrationexceeds0.75.7.Comment:IstheVocdependencyontheMoconcentrationconsistentwithremnantpolarization?Response:Thanksforreviewer’scomment.Generally,thephotovoltageoftheferroelectricphotovoltaicmaterialsisattributedtothedepolarizationfield.Therefore,theVociscloselyrelatedtothedegreeofscreeningofthespontaneouspolarization.Thedegreeofscreeningdependsonthepropertiesofferroelectricmaterialsandthemetalelectrodes,includingremnantpolarization,thedielectricconstantandthefreechargedensity.Inthiswork,theeffectofthefreechargedensityisruledoutduetouniformAuelectrodes.TheferroelectricanddielectricpropertiesshowthattheremnantpolarizationanddielectricconstantincreasewiththeincreaseofMoconcentration(FigureІ).Therefore,itissuggestedthattheVocdependsontheMoconcentrationconsistentwithremnantpolarizationanddielectricconstant.FigureІTheferroelectricanddielectricpropertiesofthethinfilmswithdifferentMoconcentration.8.Comment:NeedtoelaborateonthelargeVocenhancementwithlightintensity.Response:Thanksforreviewer’scomment.Inthiswork,theVocincreaseswiththeincreaseoflightintensity.Thesimilarphenomenonwasalsoreportedinpreviousliteratures(e.g.Adv.Mater.2010,22,1763).ItisknownthattheVocdependsontheremnantpolarizationanddielectricconstant.Tostudytheinfluenceoflightintensityonthepolarizationanddielectricconstant,wemeasuredtheferroelectricanddielectricpropertiesofthefilmwithx=0.7underdifferentlightintensity,asshowninthefigureП.Itisfoundthatthepolarizationanddielectricpropertiesenhancewiththeincreaseoflightintensity,implyingthatincreasinglightintensitycanenhancedtheVoc.FigureПTheferroelectricanddielectricpropertiesofx=0.7underdifferentlightintensity.9.Comment:MissingcolorscalebarforAFMimages.Response:Thanksforreviewer’scomment.ThecolorscalebaroftheAFMimageswereadded.10.Comment:Fig5b,EdishouldbeEbi?Response:Thanksforreviewer’scomment.ThemistakeEdiwascorrectedasEbi.ResponsestotheCommentsfromReviewer21.Comment:Thereisnographicalabstract.Theauthorswillneedprepareone.Response:Thanksforreviewer’scomment.Agraphicalabstractwasdesignedandaddedinthework.2.Comment:Thefigure1.The(abc)panelswillbeunifiedwiththesamefontsizeincludingthephasesinXRDs,scalebarofSEMandAFMs.Thecpanelrequirestheroughness