22a108c-temp,bias and operating life

JEDECSTANDARDTemperature,Bias,andOperatingLifeJESD22-A108C(RevisionofJESD22-A108-B)JUNE2005JEDECSOLIDSTATETECHNOLOGYASSOCIATIONNOTICEJEDECstandardsandpublicationscontainmaterialthathasbeenprepared,reviewed,andapprovedthroughtheJEDECBoardofDirectorslevelandsubsequentlyreviewedandapprovedbytheJEDEClegalcounsel.JEDECstandardsandpublicationsaredesignedtoservethepublicinterestthrougheliminatingmisunderstandingsbetweenmanufacturersandpurchasers,facilitatinginterchangeabilityandimprovementofproducts,andassistingthepurchaserinselectingandobtainingwithminimumdelaytheproperproductforusebythoseotherthanJEDECmembers,whetherthestandardistobeusedeitherdomesticallyorinternationally.JEDECstandardsandpublicationsareadoptedwithoutregardtowhetherornottheiradoptionmayinvolvepatentsorarticles,materials,orprocesses.BysuchactionJEDECdoesnotassumeanyliabilitytoanypatentowner,nordoesitassumeanyobligationwhatevertopartiesadoptingtheJEDECstandardsorpublications.TheinformationincludedinJEDECstandardsandpublicationsrepresentsasoundapproachtoproductspecificationandapplication,principallyfromthesolidstatedevicemanufacturerviewpoint.WithintheJEDECorganizationthereareprocedureswherebyaJEDECstandardorpublicationmaybefurtherprocessedandultimatelybecomeanANSIstandard.Noclaimstobeinconformancewiththisstandardmaybemadeunlessallrequirementsstatedinthestandardaremet.Inquiries,comments,andsuggestionsrelativetothecontentofthisJEDECstandardorpublicationshouldbeaddressedtoJEDECattheaddressbelow,orcall(703)907-7559or©JEDECSolidStateTechnologyAssociation20052500WilsonBoulevardArlington,VA22201-3834Thisdocumentmaybedownloadedfreeofcharge;howeverJEDECretainsthecopyrightonthismaterial.Bydownloadingthisfiletheindividualagreesnottochargefororreselltheresultingmaterial.PRICE:PleaserefertothecurrentCatalogofJEDECEngineeringStandardsandPublicationsonlineat!DON’TVIOLATETHELAW!ThisdocumentiscopyrightedbyJEDECandmaynotbereproducedwithoutpermission.Organizationsmayobtainpermissiontoreproducealimitednumberofcopiesthroughenteringintoalicenseagreement.Forinformation,contact:JEDECSolidStateTechnologyAssociation2500WilsonBoulevardArlington,Virginia22201-3834orcall(703)907-7559JESD22-A108CPage1TestMethodA108C(RevisionofTestMethodA108-B)TESTMETHODA108CTEMPERATURE,BIAS,ANDOPERATINGLIFE(FromJEDECBoardBallotsJCB-99-89,JCB-99-89A,andJCB-05-49,formulatedunderthecognizanceofJC-14.1CommitteeonReliabilityTestMethodsforPackagedDevices.)1PurposeThistestisusedtodeterminetheeffectsofbiasconditionsandtemperatureonsolidstatedevicesovertime.Itsimulatesthedevices’operatingconditioninanacceleratedway,andisprimarilyfordevicequalificationandreliabilitymonitoring.Aformofhightemperaturebiaslifeusingashortduration,popularlyknownasburn-in,maybeusedtoscreenforinfantmortality-relatedfailures.Thedetaileduseandapplicationofburn-inisoutsidethescopeofthisdocument.1.1ApplicabledocumentsEIA/JESD47Stress-TestDrivenQualificationofIntegratedCircuitsEIA/JEP122FailureMechanismandModelsforSiliconSemiconductorDevices2ApparatusTheperformanceofthistestrequiresequipmentthatiscapableofprovidingtheparticularstressconditionstowhichthetestsampleswillbesubjected.2.1CircuitryThecircuitrythroughwhichthesampleswillbebiasedmustbedesignedwithseveralconsiderations:2.1.1DeviceschematicThebiasingandoperatingschemesmustconsiderthelimitationsofthedeviceandshallnotoverstressthedevicesorcontributetothermalrunaway.2.1.2PowerThetestcircuitshouldbedesignedtolimitpowerdissipationsuchthat,ifadevicefailureoccurs,excessivepowerwillnotbeappliedtootherdevicesinthesample.2.2DevicemountingEquipmentdesign,ifrequired,shallprovideformountingofdevicestominimizeadverseeffectswhilepartsareunderstress,(e.g.,improperheatdissipation).JESD22-A108CPage2TestMethodA108C(RevisionofTestMethodA108-B)2Apparatus(cont’d)2.3PowersuppliesandsignalsourcesInstruments(suchasDVMs,oscilloscopes,etc.)usedtosetupandmonitorpowersuppliesandsignalsourcesshallbecalibratedandhavegoodlong-termstability.2.4EnvironmentalchamberTheenvironmentalchambershallbecapableofmaintainingthespecifiedtemperaturewithinatoleranceof±5°Cthroughoutthechamberwhilepartsareloadedandunpowered.3Definitions3.1MaximumoperatingvoltageThemaximumsupplyvoltageatwhichadeviceisspecifiedtooperateincompliancewiththeapplicabledevicespecificationordatasheet.3.2AbsolutemaximumratedvoltageThemaximumvoltagethatmaybeappliedtoadevice,beyondwhichdamage(latentorotherwise)mayoccur;itisfrequentlyspecifiedbydevicemanufacturersforaspecificdeviceand/ortechnology.3.3AbsolutemaximumratedjunctiontemperatureThemaximumjunctiontemperatureofanoperatingdevice,beyondwhichdamage(latentorotherwise)mayoccur;itisfrequentlyspecifiedbydevicemanufacturersforaspecificdeviceand/ortechnology.NOTEManufacturersmayalsospecifymaximumcasetemperaturesforspecificpackages.4ProcedureThesampledevicesshallbesubjectedtothespecifiedorselectedstressconditionsforthetimeandtemperaturerequired.4.1StressdurationThebiaslifedurationisintendedtomeetorexcee