ANSI-ESDS5.3.1-2009

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ANSI/ESDS5.3.1-2009RevisionandRedesignationofANSI/ESDSTM5.3.1-1999ForElectrostaticDischargeSensitivityTesting–ChargedDeviceModel(CDM)–ComponentLevelElectrostaticDischargeAssociation7900TurinRoad,Bldg.3Rome,NY13440AnAmericanNationalStandardApprovedDecember4,2009ANSI/ESDS5.3.1-2009ESDAssociationStandardforElectrostaticDischargeSensitivityTesting–ChargedDeviceModel(CDM)–ComponentLevelApprovedJuly31,2009ESDAssociation®ANSI/ESDS5.3.1-2009ElectrostaticDischargeAssociation(ESDA)standardsandpublicationsaredesignedtoservethepublicinterestbyeliminatingmisunderstandingsbetweenmanufacturersandpurchasers,facilitatingtheinterchangeabilityandimprovementofproductsandassistingthepurchaserinselectingandobtainingtheproperproductforhisparticularneeds.Theexistenceofsuchstandardsandpublicationsshallnotinanyrespectprecludeanymemberornon-memberoftheAssociationfrommanufacturingorsellingproductsnotconformingtosuchstandardsandpublications.NorshallthefactthatastandardorpublicationispublishedbytheAssociationprecludeitsvoluntaryusebynon-membersoftheAssociationwhetherthedocumentistobeusedeitherdomesticallyorinternationally.RecommendedstandardsandpublicationsareadoptedbytheESDAinaccordancewiththeANSIPatentpolicy.InterpretationofESDAStandards:Theinterpretationofstandardsin-so-farasitmayrelatetoaspecificproductormanufacturerisapropermatterfortheindividualcompanyconcernedandcannotbeundertakenbyanypersonactingfortheESDA.TheESDAStandardsChairmanmaymakecommentslimitedtoanexplanationorclarificationofthetechnicallanguageorprovisionsinastandard,butnotrelatedtoitsapplicationtospecificproductsandmanufacterers.NootherpersonisauthorizedtocommentonbehalfoftheESDAonanyESDAStandard.THECONTENTSOFESDA’SSTANDARDSANDPUBLICATIONSAREPROVIDED“AS-IS,”ANDESDAMAKESNOREPRESENTATIONSORWARRANTIES,EXPRESSORIMPLIED,OFANYKINDWITHRESPECTTOSUCHCONTENTS.ESDADISCLAIMSALLREPRESENTATIONSANDWARRANTIES,INCLUDINGWITHOUTLIMITATION,WARRANTIESOFMERCHANTABILITY,FITNESSFORPARTICULARPURPOSEORUSE,TITLEANDNON-INFRINGEMENT.ESDASTANDARDSANDPUBLICATIONSARECONSIDEREDTECHNICALLYSOUNDATTHETIMETHEYAREAPPROVEDFORPUBLICATION.THEYARENOTASUBSTITUTEFORAPRODUCTSELLER’SORUSER’SOWNJUDGEMENTWITHRESPECTTOANYPARTICULARPRODUCTDISCUSSED,ANDESDADOESNOTUNDERTAKETOGUARANTYTHEPERFORMANCEOFANYINDIVIDUALMANUFACTURERS’PRODUCTSBYVIRTUEOFSUCHSTANDARDSORPUBLICATIONS.THUS,ESDAEXPRESSLYDISLAIMSANYRESPONSIBILITYFORDAMAGESARISINGFROMTHEUSE,APPLICATION,ORRELIANCEBYOTHERSONTHEINFORMATIONCONTAINEDINTHESESTANDARDSORPUBLICATIONS.NEITHERESDA,NORITSMEMBERS,OFFICERS,EMPLOYEESOROTHERREPRESENTATIVESWILLBELIABLEFORDAMAGESARISINGOUTOFORINCONNECTIONWITHTHEUSEORMISUSEOFESDASTANDARDSORPUBLICATIONS,EVENIFADVISEDOFTHEPOSSIBILITYTHEROF.THISISACOMPREHENSIVELIMITATIONOFLIABILITYTHATAPPLIESTOALLDAMAGESOFANYKIND,INCLUDINGWITHOUTLIMITATION,LOSSOFDATA,INCOMEORPROFIT,LOSSOFORDAMAGETOPROPERTYANDCLAIMSOFTHIRDPARTIES.Publishedby:ElectrostaticDischargeAssociation7900TurinRoad,Bldg.3Rome,NY13440Copyright©2009byESDAssociationAllrightsreservedNopartofthispublicationmaybereproducedinanyform,inanelectronicretrievalsystemorotherwise,withoutthepriorwrittenpermissionofthepublisher.PrintedintheUnitedStatesofAmericaISBN:1-58537-179-3CAUTIONNOTICEDISCLAIMEROFWARRANTIESDISCLAIMEROFGUARANTYLIMITATIONONESDA’sLIABILITYANSI/ESDS5.3.1-2009i(ThisforewordisnotpartofESDAssociationStandardANSI/ESDS5.3.1-2009)FOREWORDTheearliestelectrostaticdischarge(ESD)testmodelsandstandardssimulateachargedobjectapproachingacomponentanddischargingthroughthecomponent.However,withtheincreasinguseofautomatedcomponenthandlingsystemsanotherpotentiallydestructivedischargemechanism,thechargeddevicemodel(CDM)becomesincreasinglyimportant.IntheCDMacomponentitselfbecomescharged(e.g.,byslidingonasurface(tribocharging)orbyelectricfieldinduction)andisrapidlydischarged(byanESDevent)asitcloselyapproachesaconductiveobject.AccuratelyquantifyingtheCDMdischargeeventisverydifficult,ifnotimpossible,duetothelimitationsofthemeasuringequipmentanditsinfluenceonthedischargeevent.TheCDMdischargeisgenerallycompletedinafewnanoseconds,andpeakcurrentsoftensofampereshavebeenobserved.Thepeakcurrentintothecomponentwillvaryconsiderablydependingonalargenumberoffactors,includingpackagetypeandparasitics.ThetypicalfailuremechanismobservedinMOScomponentsfortheCDMmodelisdielectricdamage,althoughotherdamagehasbeennoted.TheCDMsensitivityofagivencomponentispackagedependent.Anintegratedcircuit(IC)chipinasmalloutlinepackage(SOP)configurationmaybemoresusceptibletoCDMdamagewhencomparedtoadual-in-line(DIL)packageconfiguration.ICsinthin,smalloutlinepackages(TSOP),orpingridarray(PGA)packagestypicallyhavethelowestCDMwithstandvoltage.BasedonresultsobtainedwithearlyCDMtesters(notnecessarilymeetingthewaveformrequirementsofthisstandard),componentswithCDMsensitivitiesof500voltsorlessproveddifficulttohandlewithoutdamage.ComponentswithCDMsensitivitiesof1,000voltsormoredidnotexperiencemajorfieldproblemswhenproperhandlingtechniqueswerefollowed.RecentdataindicatewithproperESDcontrols,safehandlingofdeviceswithCDMsensitivitiesof250Visachieved.Wavef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