HOSONIC晶振

CONTENTSTAPE/REELTapeAndReelSpecificationforSMDProductsSMDVCXOVC-SSMDVCXOCMOSOutput7.0x5.0x1.8mm6Pad20212326CRYSTALUNITSDT-26&DT-38TuningforkQuartzCrystalHC-49SLowProfileHolderTypeCrystalUnitsSMDCRYSTALUNITS33343527SMDCRYSTALOSCILLATOROrderingGuideofCrystalOscillator282931HXO-3SeriesSMDOscillator7.0x5.0x1.5mm5.0V&3.3V&2.8V&1.8VHXO-SSeriesSMDOscillator3.2x2.5x1.2mm5.0V&3.3V&2.8V&1.8VHXO-5SeriesSMDOscillator5.0x3.2x1.3mm5.0V&3.3V&2.8V&1.8VHXO-NSeriesSMDOscillator2.5x2.0x0.9mm3.3V&2.8V&1.8V&1.5VPROGRAMMABLECRYSTALOSCILLATORHXO-QSeriesSMDProgrammableOscillator3.3V&2.5V&1.8VPECL&LVDSCRYSTALOSCILLATORHXO-PSeriesSMDPECLOscillatorOutput7.0x5.0x1.8mm3.3V&2.5VVC7CCSMDVCXOHighfrequencyCMOSOutput7.0x5.0x1.8mm6PadOrderingGuideofCrystalUnits19146HCX-4SBSMDCrystal4.0x2.5x0.85mmSeamSealing9HCX-5SBSMDCrystal5.0x3.2x0.90mmSeamSealing101114155HCX-1ABSMDCrystal2.0x1.6x0.50mmSeamSealing2HCX-2SBSMDCrystal2.5x2.0x0.65mmSeamSealing7813HCX-5FASMDCrystal5.0x3.2x1.40mmGlassSealing2Pad17ListofCrystalUnitModelNamesCRYSTALUNITSSMDCRYSTALOSCILLATORListofCrystalOscillatorModelNames122425CrystalunitsSMDCrystalunitsSMDCrystaloscillatorCrystalunitsHCX-7SBSMDCrystal7.0x5.0x1.20mmSeamSealingHCX-3FBSMDCrystal3.2x2.5x0.90mmGlassSealingHCX-8FASMDCrystal8.0x4.5x1.60mmGlassSealing2PadVC-TSMDVCXOCMOSOutput5.0x3.2x1.3mm6Pad32Tape/reelSMDVCXOPECL&LVDSCrystaloscillatorHCX-TABSMDCrystal1.6x1.2x0.37mmAu/SnSealingHCX-3SBSMDCrystal3.2x2.5x0.75mmSeamSealingHCX-6SBSMDCrystal6.0x3.5x1.10mmSeamSealingPartNumberingSystemofSMDCrystalUnitsPartNumberingSystemofCrystalUnitsPartNumberingSystemofProgrammalbe/PECL/LVDSOscillatorPartNumberingSystemofSMDCrystalOscillatorPartNumberingSystemofVCXO316HC-49SMLowProfileHolderTypeCrystalUnits1822HXO-MSeriesSMDOscillator2.0x1.6x0.8mm3.3V&2.8V&1.8VProgrammableCrystaloscillator30HXO-TSeriesSMDLVDSOscillatorOutput7.0x5.0x1.8mm3.3V&2.5VTAIWAN:HOSONICELECTRONICCO.,LTD.23-1LANE84.CHUNYINGST.SHULINCHEN.TAIPEI23804.TAIWANWEBSITE::::ORDERINGGUIDECRYSTALUNITSThisguideisatermsanddefinitionsofcrystalunits,itisusedtoassistanyoneinyourorganizationstoselectororderHosonic'scrystalunits.1.NominalFrequency-Isthenumberofcyclespersecond(Hz)ofanalternatingelectriccurrent.EnterthefrequencyinMHzorKHz.2.PackageStyle-Determinestypesoflayout,through-holeorsurfacemount(SMD).Plsseecatalogueforyouridealpackage.3.VibrationMode-ItisconcernprimarilywhenspecifyingtheATcutcrystalunits.Theseunitsincreaseinfrequencyasthethicknessoftheresonatorplateisdiminished.Atsomepoint,typicallyaround30MHz,theplatebecomestoothinforefficientprocessing.AstheATwillresonateatoddintegermultiplesofthefundamentalfrequency,itisnecessarytospecifythedesiredorderofovertonewhenorderinghigherfrequencycrystals.4.MaximumSeriesResistance(ohms)-Standardresistancevaluesaresuppliedinourliterature.Iflowerresistancevaluesarerequired,Thecrystalsaremoredifficulttomakeandmoreexpensivetoproduce.Specifyifotherthanstandardvaluesareneeded.5.Temperature-Crystalsarethekeycomponentinanoscillatorcircuitandtheyareaffectedbyambientconditions,particul-arlythetemperature.FrequencyTolerance:Frequencytolerancereferstotheallowabledeviationfromnominalataspecifictemperat-ureof25℃.FrequencyStability:itreferstotheallowabledeviationoveraspecifiedtemperaturerange.OperatingTemperature:temperaturerangewithinwhichoutputfrequencyandotherelectrical,acteristicsmeetthespecifications.environmentalchar-6.LoadCapacitance-Forcrystalsinseriescircuits,loadcap-acitanceisnotapplicable.Theloadcapacitanceofparallelcircuitsshouldbespecifiedinpicofarads(pF).20pFand16pFloadcapacitancearecommonrequirements.Thisisaveryimportantorderinginformation.7.DriveLevel-Theamountofpowerdissipatedbythecrystalinagivenoperatingcircuitandisexpressedinmilliwattsormicrowatts.Excessivedrivelevelwillresultinpossiblefra-ctureofthequartzresonatororexcessivelong-termdrift.Anindicationofexcessivedrivelevelisaconstantupwardfre-quencydrift.Ourtypicaltestdrivelevelis0.1mW.8.ShuntCapacitance-Thestaticcapacitancebetweenthecrystalterminal.Measuredinpicofarads(pF),Shuntcapacit-anceispresentwhetherthedeviceisoscillatingornot(unre-latedtothepiezoelectriceffectofthequartz).Shuntcapacit-anceisderivedfromthedielectricofthequartz,theareaofthecrystalelectrodes,andthecapacitancepresentedbythecrystalholder.9.Aging-Agingreferstothecumulativechangeinfrequencyexperiencedbyacrystalunitovertime.Therateoffrequencychangeisfastestduringthefirst45daysofoperation.Themostcommonfactorsaffectingagingincludedrivelevel,in-ternalcontamination,crystalsurfacechange,ambienttempe-rature,wirefatigueandfrictionalwear.10.Pullability-Itreferstothechangeinfrequencyofacrystalunits,eitherfromthenaturalresonantfrequency(Fr)toaloadresonantfrequency(FL).Orfromoneloadresonantfrequencytoanother.Theamountofpullabilityexhibitedbyagivencrystalunitsatagive