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:2005-12-25:(1972-),,,,.X(,110136):X,X.:X;;:TH74414:A:1673-1603(2006)03-0281-02,X.1X1,X(),,X.1X2XX,,.,,,.,().3X311().().,4.312XX,.()2.X,:();();();();();().313XX.1)..,.2.,..,,,2320067()JournalofShenyangInstituteofEngineering(NaturalScience)Vol12No13Jul.2006..,IiXi.Ii=KiXi/Um(1),Ki;Xi;Um,Xi.Um,K[1],5%.2).X,,..,..,.3).,.,,,d,,d.,X.4).X,.ScherrerHall.5).,.,..2X.2X4,X.,.,X.[1].[M].:,2000.[2].X[J].:,2002(11).ApplicationofXradialdiffractiononmaterialanalysisZHANGXiao-hui(EducationalAffairsDivision,ShenyangInstituteofEngineering,Shenyang110136,China)Abstract:StatesthegenerationprincipleofXradial,analysiscontentofXradialdiffractionanditsapplicationonmaterialanalysis.Keywords:Xradialdiffraction;materialanalysis;application282()2