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/SiO2SiO23,,(,300160):,,SiO2,(UHMWPE)UHMWPE/SiO2,,,UHMWPE,SiO2UHMWPE8/10,SiO2,UHMWPE,,,,;SiO2,SiO2,,,,:;;;:TM912.9:A:100129731(2009)06209902041,,,(UHMWPE),,[13],(1.0106),UHMWPE,;,,,UHMWPE,,1106UHMWPE-27GPa100GPa[4,5]Lopatin[6]UHMWPE/,(HDPE),UHMWPETakia[7]UHMWPEHDPE,UHMWPE,UHMWPE/[8],UHMWPE,,UHMWPE[9],UHMWPE,/SiO2,,UHM2WPE/SiO2,UHMWPE,UHMWPE22.1UHMWPE,M,3.65106,;7#,;1076,;(26m)SiO2,;,2.2UHMWPE,SiO2UHMWPE,UHMWPE5%150,20,3min48h,12h,,,I;12h,,,,(,,)60%24h,,2.32.3.10.1MPa(J)0.1MPa09920096(40)3:(973)(2007AA030304);(08ZCGYGX03700):2008212201:2009203231::(1982-),,,,,15min,,[10]:J=VSt(1),V(L),S(m2),t(h)2.3.2LaurelCFP211002A32.3.3()[11],:(%)=1-bt100(2),b,t2.3.4DSCNETZSCHDSC200F3,1/min0200,5min20/min0,DSC[12]:Xc(%)=HHm100(3)H(J/g),Hm,273J/g[13]2.3.5FEIQuanta200(SEM)UHMWPE,,2.3.6X(WAXD)PhilipsXpertMPDXUHMWPE,,CuK,40kV45mA,8/min,2570Sherrer[14],WAXD,:Dhkl=kcoshkl(4),hkl(hkl)BraggX,Dhkl(hkl);(,)kSherrer33.11()1,UHMWPE,,UHM2WPE[15],UHMWPE,,,UHMWPE[16],UH2MWPE,1DSCFig1EffectofdiluentonDSCcurvesintheascendingrangeanddescendingrange1UHMWPETable1Effectofdiluentonbehaviorsofmeltingandcrystallization()()()(%)UHMWPEpowder139.995.68109.0068.50UHMWPE/Diluent113.544.6591.07UHMWPEmembrane123.0311.9393.3620.05,UHMWPE,,,[17],()[18]:1Tm-1T0m=RVAH0mV11P1-121(5),VAV1;1;P1;1,T0m,H0m,Tm,UHMWPEUHMWPE[19],10,TmT0m3.2SiO222,SiO2UHMWPE8/10,SiO2,UHMWPE199:/SiO2SiO2,,,,,SiO2107.29,SiO2,SiO2,UHMWPE,,,,[20,21],SiO2,UHMWPE,,UHMWPE,,,3,SiO2SiO2220.9823.36(110)(200),,SiO2UHMWPE,(110)(200)SiO2SiO2UHMWPE/,,UHMWPE,[22,23]2SiO2UHMWPEDSCFig2DSCcurvesofUHMWPEsolutionwithdiffer2entSiO2contentintheascendingrangeandde2scendingrange2SiO2UHMWPETable2EffectofSiO2contentonbehaviorsofmeltingandcrystallization()()()(%)D110(nm)D200(nm)UHMWPE/Diluent113.544.6591.075.5213.1016.09UHMWPE/SiO2(10/4)/Diluent114.465.9096.296.9511.9413.35UHMWPE/SiO2(10/8)/Diluent115.518.5697.118.4312.009.33UHMWPE/SiO2(10/12)/Diluent113.384.9190.444.469.275.373SiO2UHMWPEXFig3X2raydiffractionpatternofUHMWPEsolutionwithdifferentSiO2contentSiO2,SiO2,UHMWPE,,,,,,,UHMWPE,,,,107.29WAXD,3.3SiO245,SiO2UHMWPE,SiO2,,,UHMWPE,,,,29920096(40)(6(a)),SiO2,UHMWPE,,SiO2,(6(b,c)),SiO2,,,,,,,(2),,(6(d)),,[24],6SiO2SEMFig6Cross2sectionalSEMgraphsofUHMWPEmembrane(a),UHMWPE/SiO2(10/4wt/wt)membranes(b),andUHMWPE/SiO2(10/8wt/wt)membranes(c),UHMWPE/SiO2(10/12wt/wt)membranes(d)4,,,SiO2UHM2WPE,,SiO2,UHMWPE,,UHMWPE,UHMWPE,UHMWPE;SiO2UHMWPE8/10,SiO2,UHMWPE,,;SiO2,;SiO2,:[1]CohenY,ReinDM,VaykhanskyL.[J].CompositesSci2enceandTechnology,1997,57:114921154.[2]TurellMB,BellareA.[J].Biomaterials,2004,25:338923398.[3]KurtzSM,MuratogluOK,EvansM,etal.[J].Biomate2rials,1999,20:165921688.[4]SmithP,LemstraPJ,BooijHC.[J].JPolymSciPolymPhysEd,1981,19:8772888.[5]TsubakiharaS,NakamuraA,YasuniwaM.[J].PolymerJournal,28:4892495.[6]LopatinG,YenLY,etal.[P].USP:B01D4778601,1988210218.[7]TakiaK,FunaokaH,KaimaiN.[P].USP:B01D6245272,200126212.[8],,,.[J].,2003,19(1):24227.[9],,.[J].,2007,38():273122734.[10].[M].:,2000.2402283.[11]KimJM,MinBR,PerkHC,etal.[J].JApplPolymSci,2001,81:348123488.[12]BenedettiE,CatanorchiS,AlessioAD,etal.[J].PolymInt,1996,41:35241.[13].[J].,1994,5:2472253.[14]SmookJ,PenningsJ.[J].Colloid&PolymerSci,1984,262:7122722.[15]XiaoChangfa,ZhangYufeng,AnShulin,etal.[J].JAp2plPolymSci,2000,77:287722881.[16],,.()[M].:,1982.2092210.[17],,.()[M].:,1988.70273.[18]WunderlichB,MacromolecularPhysics(Vol3)[M].NewYork:AcademicPress,1976.[19].[D].:,2006.[20]WangKH,ChoiMH,KooCM.[J].JPolymSciPartBPolymPhys,2002,40:145421463.[21],,.[J].,2003,3:3812386.[22],,.[J].,2003,3:68271.[23],,.[J].,2001,5:5892593.[24]LaxminarayanA,MeguireKS,KimSS.[J].Polym,1994,35(14):306023068.(997)399:/SiO2SiO2[10],,,.[J].,2004,14(1):33235.[11].[J].,2002,1:40245.[12]ColesBR,CaplinAD.[M].:,1985.[13]YusoffAN,AbdullahMH.[J].JournalofMagnetismandMagneticMaterials,2004,269:2712280.[14]DavidC.[J].JournaloftheEuropeanCeramicSociety,2003,23:272122726.[15],.[J].,1998,29(5):36239.[16].()[M].:,1998.Effectofdopingthedifferentrare2earthoxideonwaveabsorbabilityofNi2Znferrite/Al2alloyfoamsmaterialsZHANGYu,XUEXiang2xin(LiaoningKeyLab.forEcologicallyComprehensiveUtilizationofBoronResource&MaterialsinSchoolofMaterialsandMetallurgy,NorthesternUniversity,Shenyang110004,China)Abstract:Exploringtheeffectofdopingdifferentrare2earthoxideonthemicrowaveabsorbingpropertyofNi2Znferrite/Al2alloyfoams,thesurfaceofAl2alloyfoamswasseparatelycoatedwithNi2Znferrite(CFe),andNi2Znferritedoping1%(masspercent)differentrare2earthoxide(Dy2O3,CeO,Ld2O3)andcompoundpowderofDy2O3,CeO,Ld2O3andNi2Znferrite,thecoatedAl2alloyfoamsweretsteedaccordingtotheStandardGJB2038294methodtotestthereflectivityofradarabsorbingmaterials,ie.,theRCS(radarcross2section)method.Sur2facetopographyofabsentwereanalysedthroughscanningelectronmicroscopy(SEM).Theresultindicatedthatinthe12218GHzand26.5240GHzbandtheabsorbingpropertiesincreasewiththeincreaseoffrequency,afterdopedtherareearthoxide,theabsorbabilityofthecompoundmaterialwasenhancement.So,theabsorbabilityofAl2alloyfoamscoatedpowdercompoundofNi2Znferriteinreasonableproportiont