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半导体集成电路可靠性测试及数据处理作者：龚斌学位授予单位：复旦大学参考文献(75条)1.史保华.贾新章.张德胜微电子器件可靠性19992.居滋培可靠性工程20003.中国电子技术标准化研究所可靠性试验用表19874.茆诗松.王玲玲可靠性统计19845.茆诗松.王玲玲加速寿命试验19976.张志华加速寿命试验及其统计分析20027.马海训.李彩霞加速寿命试验数据分析19988.茆诗松统计手册20039.陆璇应用统计199910.金星.洪延姬.沈怀容可靠性数据计算及应用200311.NelsonWAcceleratedLifeTestingStep-stressModelsandDataAnalysis198012.LawlessJEJohn.茆诗松寿命数据中的统计模型与方法198813.NBalakrishnan.ACliffordCohenOrderStatisticsandInferenceEstimationMethods199114.EIA/JESD37.StandardforLognormalAnalysisofUncensordData,andofSinglyRight-CensoredDataUtilizingthePerssonandRootzenMethod199215.BugaighisMMEfficienciesofMLEandBLUEforparametersofanacceleratedlife-testmodel[外文期刊]1988(02)16.AdatiaABestlinearunbiasedestimatoroftheRayleighscaleparameterbasedonfairlylargecensoredsamples[外文期刊]1995(02)17.BalakrishnanN.LinC-T.ChanP-SAComparisonofTwoSimplePredictionIntervalsforExponentialDistribution[外文期刊]2005(01)18.GuidaM.LongoM.LopsMBiparametricCFARproceduresforlognormaiclutter1993(03)19.WangW.KececiogluDBFittingtheWeibulllog-linearmodeltoacceleratedlife-testdata[外文期刊]2000(02)20.ShimokawaT.MinLiaoGoodness-of-fittestsfortype-Ⅰextreme-valueand2-parameterWeibulldistributions1999(01)21.BugaighisMMPercentilesofpivotalratiosfortheMLEoftheparametersofaWeibullregressionmodel[外文期刊]1993(01)22.BugaighisMMPropertiesoftheMLEforparametersofaWeibullregressionmodelundertypeⅠcensoring1990(01)23.JiangS.KececiogluDMaximumlikelihoodestimates,fromcensoreddata,formixed-Weibulldistributions1992(02)24.VajdaI.vanderMeulenECOptimizationofBarrondensityestimates2001(05)25.BaiDS.YunHJAcceleratedlifetestsforproductsofunequalsize[外文期刊]1996(04)26.BaiDS.ChaMS.ChungSWOptimumsimpleramp-testsfortheWeibulldistributionandtype-Ⅰcensoring1992(03)27.CacciariM.MontanariGCDiscussion,withreply,on'EstimatingthecumulativeprobabilityoffailuredatapointstobeplottedonWeibunandotherprobabilitypaper1991(06)28.SolimanAAReliabilityestimationinageneralizedlife-modelwithapplicationtotheBurr-Ⅻ2002(03)29.TangLC.SunYSAnalysisofstep-stressaccelerated-life-testdata:anewapproach1996(01)30.茆诗松指数分布场合下步进应力加速寿命试验的统计分析198531.SIAInternationalTechnologyRoadmapforSemiconductors200432.何晓群现代统计分析方法与应用199833.谢衷洁普通统计学200434.费业泰误差理论与数据处理200435.RLMason.RFGunst.JLHessStatisticaldesignandanalysisofexperimentswithapplicationstoengineeringandscience36.EricWWeissteinLeastSquaresFittingFromMathWorld--AWolframWebResource37.EricWWeissteinLeastSquaresFitting-PerpendicularOffsets.FromMathWorld-AWolframWebResolurce38.JMPStatistics&GraphicsGuide39.GB/T2689.1.恒定应力寿命试验和加速寿命试验方法总则198140.GB/T2689.2.寿命试验和加速寿命试验的图估计法(用于威布尔分布)198141.GB/T2689.3.寿命试验和加速寿命试验的简单线性无偏估计法(用于威布尔分布)198142.GB/T2689.4.寿命试验和加速寿命试验的最好线性无偏估计法(用于威布尔分布)198143.WTKaryChien.CharlesHJHuangPracticalBuilding-InReliability(BIR)ApproachesforSemiconductorManufacturing2002(04)44.EIA/JESD659-A.Failure-Mechanism-DrivenReliabilityMonitoring199945.EIA/JEP143.SolidStateReliabilityAssessmentandQualificationMethodologies200146.EIA/JEP122B.FailureMechanismsandModelsforSemiconductorDevices200347.EIA/JESD91A.MethodforDevelopingAccelerationModelsforElectronicComponentFailureMechanisms200348.EIA/JESD28-A.AProcedureforMeasuringN-ChannelMOSFETHot-Carrier-InducedDegradationunderDCStress200149.EIA/JESD60.AProcedureforMeasuringP-ChannelMOSFETHot-Carrier-InducedDegradationatMaximumGateCurrentUnderDCStress199750.EIA/JESD28-1.N-ChannelMOSFETHotCarrierDataAnalysis200151.EIA/JESD35-A.ProcedurefortheWafer-LevelTestingofThinDielectrics200152.EIA/JESD35-2.TestCriteriafortheWafer-LevelTestingofThinDielectrics199653.EIA/JESD61.IsothermaIElectromigrationTestProcedure199754.EIA/JEP119A.AProcedureforPerformingSWEAT200355.EIA/JESD63.StandardMethodforCalculatingtheElectromigrationModelParametersforCurrentDensityandTemperature199856.FSA/JEDECJP001.01.FoundryProcessQualificaitonGuidelines(WaferFabricationManufacturingSites)200457.EIA/JESD87.StandardTestStructuresforReliabilityAssessmentofAlCuMetallizationswithBarrierMaterials200158.MicrosoftCorpMicrosoftExcel在线帮助59.SummerFCTseng.WTKaryChien.ExcimerGong.Bing-ChuCaiACost-EffectiveWaferLevelReliabilityTestSystemforIntegratedCircuitMakers2003(05)60.顾瑛可靠性工程数学200461.JFLawless.峁诗松寿命数据中的统计模型与方法199862.NicholasRFarnum.PaulBoothUniquenessofMaximumLikelihoodEstimatorsofthe2-Parameter、WeibullDistribution1997(04)63.JCFothergillEstimatingtheCumulativeProbabilityofFailureDataPointstobePlottedonWeibullandotherProbabilityPaper[外文期刊]1990(03)64.JeanJacquelinAReliableAlgorithmfortheExactMedianRankFunction[外文期刊]1993(02)65.JeanJacquelinGeneralizationoftheMethodofMaximumLikelihood1993(01)66.JSWhiteThemomentsoflog-Weibullorderstatistics1969(02)67.RRoseGraphicalmethodsforPlottingandEvaluatingEeibullDistributedData199468.RRoseRecentdevelopmentsonWeibullStatistics199769.RRoseComparingLinearRegressionandMaximumLikelihoodMethodstoEstimateWeibullDistributionsonLimitedDataSets199970.RRoseFormulastoDescribetheBiasandStandardDeviationoftheML-estimatedWeibullShapeParameter[外文期刊]1994(02)71.RRoseBiasandStandardDeviationduetoWeibullParameterEstimationforSmallDatasets[外文期刊]1996(01)72.MCacciariComparisonofMaximunLikelihoodU