电子与计算机技术(仪器分析-英文版)

16:54:15计算机与仪器分析一、计算机对仪器分析发展的促进作用improvetodevelopmentofinstrumentsanalysis二、计算机在仪器分析中的应用applicationofcomputerininstrumentsanalysis三、网络中的仪器分析资源resourceofinstrumentsanalysisininternet16:54:15GoalsofAnalyticalChemistryWhatisit?IdentificationQualitativeAnalysisHowmuch?QuantitativeAnalysisInstrumentalAnalysisinthe21stCenturyBetterandFasterMoreData(Images)MiniaturizationBetterdataprocessingmethods-Chemometrics16:54:15AnalyticalInstrumentsStimulusResponseEnergySourceSystemstudiedAnalyticalInformationAnalyticalSignals•DataDomain–informationencoded•Non-electricalDomains(scale,number,chemical)•ElectricalDomains–(volts,current,charge)•AnalogDomains–continuousquantities(volts,current)•TimeDomains–(pulses,slopes)•DigitalDomains–(Off/OnorHi/Lo)16:54:15TimeDomainsPulsesSlope/shape16:54:15Time=DigitalDomainsContinuousHi/Lo16:54:15DigitalDomainsCountbase10Binary16:54:15InstrumentalComponents16:54:15InstrumentComponentsSignalSourceSampleSignalAnalyzerSignalDetector/TransducerDataProcessor4.23Answer16:54:15FluorometerComponents16:54:15SelectinganAnalyticalMethodRequiredAccuracyAmountofsampleConcentrationrange(s)ofanalyte(s)PossibleinterferencesChemicalandphysicalpropertiesofmatrixNumberofsamples16:54:15DesirableCharacteristicsforanAnalyticalMethodSpeedEaseandConvenienceSkillrequiredofoperatorCostandavailabilityofequipmentPer-samplescost16:54:15NumericalCriteriaforSelectinganAnalyticalMethodPrecisionAbsolutestandarddeviationRelativestandarddeviationCoefficientofvariationVarianceBiasAbsolutesystematicerrorRelativesystematicerrorSensitivityCalibrationAnalyticalDetectionLimitBlankplusthreetimesStd.Dev.ofblankConcentrationRangeLimitofQuantitation(LOQ)LimitofLinearity(LOL)SelectivityEffectsofinterferencesCoefficientofSelectivity16:54:15Precision–FiguresofMerit.determinedwasmeanthetimesofnumbernwhere,/meantheofdeviationStandard%100variationoftCoefficiendeviationstandardRelative1)(deviationstandardAbsolute__2_1nssxsCVxsRDSNxxsmNii16:54:15CalibrationSensitivityy)Sensitiviton(CalibratislopeblankofsignalionconcentratsignalwheremScSSmcSblbl16:54:15CalibrationSensitivity(m)blSmcSScSblm=slope16:54:15AnalyticalSensitivitytmeasurementheofdeviationstandardslopewhere/sssmsm16:54:15SignalDetectionLimitforLOQ10andLimit.forDetect3signalblankofdeviationstandardsignalblankmeansignalhabledistinguisminimum,__ksSSwhereskSSblblmblblm16:54:15ConcentrationDetectionLimitmSScmSScSmcSskSSblmmblblblblm_16:54:15LimitsofQuantitationandLinearity16:54:15Example-Sensitivity16:54:15Selectivitytscoefficienyselectivitthearesk'thewhere)(//,,,,blCCACBABAAACACABABblCCBBAASckckcmSmmkmmkScmcmcmS16:54:15CalibrationSelectivityScASblmA=slopemB=slopemC=slopecBcC16:54:15InstrumentalAnalysisChapter2ACCircuitsandSemiconductors16:54:15AlternatingCurrentsI16:54:15AlternatingCurrentsII16:54:15AlternatingSignals16:54:15AlternatingSignalswithdifferentamplitudesandphasesI16:54:15AlternatingSignalswithdifferentamplitudesandphasesII16:54:15AlternatingandDirectCurrents–RootMeanSquareValues16:54:15CapacitorsCapacitor–pairofconductorsseparatedbyadielectricsubstance(electricalinsulator).Similartoatemporarystoragebattery.DielectricConductors16:54:15RCCircuitsISwitchon1Switchon216:54:15RCCircuitsIIdtdvCdtdqiCvqCVQQCCCcircuitsacinchargeelectricalecapacitanc16:54:15RCCircuitsIIIdtdiRdtdqCdtdiRdtdqCdtdViRCqVvvViiRCi11016:54:15RCCircuitsIVRCtinittiIeIiRCdtidiRCdtididtdiRCidtdqCinit/0116:54:15RCCircuitsVRCtinittiIeIiRCdtidiinit/016:54:15RCCircuitsVI)1(///RCtiCRCtiRRCtinitevvevveIi16:54:15RCCircuitswithacSourceIftIiftVvppi2sin2sinCRacsource16:54:15RCCircuitswithacSourceIIftIdtdvCdtdvCdtdqifIipCCp2sin2sinCRacsourcePhaseShift16:54:15RCCircuitswithacSourceIIIftIiftVvftfCIvftfCIvdtftCIvftIdtdvCppCpCpCtpCpC2sin)902(sin)902(sin2)2cos(22sin2sin0CRacsourcePhaseShift16:54:15CapacitiveReactanceIfCIVftVvftfCIvIVpppCpCCCpp2)902(sin)902(sin2-equationsCompareresistor)ainresistance(likereactancecapacitive16:54:15CapacitiveReactanceIIfCfCIIIVfCIVIVCppppCppCpp212216:54:15Impedance“Z”inaRCCircuit2221fCRZ16:54:15Ohm’sLawforRCCircuits22222121fCRIZIVfCRVZVIpppppp16:54:15RCFiltersIHigh/LowPassZRVVRVIfCRVZVIipopoppipipp)()()(currentwithphaseinisresistoracrossVoltage21)()(PassHigh22ZVVZVVZVIIVCipopCipopippCpop)()()()()()(PassLow16:54:15RCFiltersIIHigh/LowPassZRVVipop)()(PassHighZVVCipop)()(PassLow16:54:15RCFiltersIIIHigh/LowPass16:54:15MultimetersIVoltageMeasurementsCurrentMeasurementsResistanceMeasurements16:54:15MultimetersII16:54:15SemiconductorsDiodesISidopedwithGpIIIelements,InorGaSidopedwithGpVelements,AsorSb+-16:54:15SemiconductorsDiodesII16:54:15SemiconductorsDiodesIIIForwardBiasReverseBias16:54:15SemiconductorsTransistorsIpnp-typenpn-type16:54:15SemiconductorsTransistorsIIinputoutputBIBIBICBEIIIECII16:54:15SemiconductorsTransistorsIV16:54:15Transformers16:54:15Rectifiers16:54