电子设备环境温度试验方法的研究

20011:;:;:(,264001),,,,:TestMethodResearchofAmbientTemperatureforElectronicEquipmentJinHuiqinWangHaotongZhouXinli(NavalAeronauticalEngineeringAcademy,ShandongYantai264001)Abstract:Highandlowtemperaturetestisoneofthefoundationsofelectronicequipmentcustomiza2tion.Simplehighandlowtemperaturetestcannotreflecttheelectronicequipmentadaptabilityforambienttemperature.Adaptabilitytestofambienttemperaturemustbedone.Thetestmethodofelectronicequip2mentambienttemperatureisproposedonthebasisoftroubleintheelectronicequipmenttestinthispaper.Thismethodcanbeappliedtothemaintenanceofelectronicequipmentsimilarly.Keywords:Electronicequipment,ambienttemperature,workingtemperature,failuretemperature.1,;(),:-45+55()-55+70(),()(),,,,[1],,,,,2,163Vol116No13JOURNALOFELECTRONIC20029MEASUREMENTANDINSTRUMENT47©1994-2006ChinaAcademicJournalElectronicPublishingHouse.Allrightsreserved.,:+55()+70();-45()-55(),,10/min,-21-22+38+3921121111,,,(),,,,10T1,,T1T0,,,,,,,,T0,,,,[3]T0T2,,,,,T2,,,T1T21221112,2:,,21113,,-21-22,-4816©1994-2006ChinaAcademicJournalElectronicPublishingHouse.Allrightsreserved.,34--,3,,-21-22,,C1C2,,;4,,C1C2,,C1C2,-21-22,,,()C1C2,3-4-212,+38+39AD574AT,AD574ATAD574AT,,,,,,3,,()(),[2],,5T0T1;T1T2;T2T3;349©1994-2006ChinaAcademicJournalElectronicPublishingHouse.Allrightsreserved.;T4T5T2T3;T5T6;T6T7,,,,,(),6:V1V2,,,,,564,,,,,30,-20;,30,0,,,(),,(),,,,,(),,,5016©1994-2006ChinaAcademicJournalElectronicPublishingHouse.Allrightsreserved.[1],1987.1.[2]1993.1.[3],,,,,1999.2.[4],MTLAB5.X,,1999.8.:,1964,,,:,19588,,(16):,19743,,,10:,,:,,(39):19887,19933,351©1994-2006ChinaAcademicJournalElectronicPublishingHouse.Allrightsreserved.