ANSIIEEE Std 4-1978 IEEE standard techniques for h

llllllStandardTechnlquerforHigh-VoltageTertlngSlxthRdltlonIEEEStd4-1978establishesstan-dardmethodsofmeasurementofhigh-voltageandbasictestingtech-niquesforapplicationtoalltypesofapparatusforalternatingvoltages,directvoltages,lightningimpulsevoltages,switchingimpulsevolt-ages,andimpulsecurrents.Itisanew,greatlyenlargedrevisionofIEEEStd4-1968,TechniquesforDielectricTests.Section1isdevotedtothedefini-tionoftermsforgeneralapplica-tions,andthepresentationofgener-alrequirementsregardingtestob-jectsandtestprocedures.Section2definestermsrelatingtothespecifictestsanddescribesmethodsforgenerationandmeasurementoftestvoltagesandcurrents,fortesting,andfortheevaluationoftestresults.Applicabletodevicesandtocom-pletesystemsusedforthemeasure-mentofvoltagesandcurrentsdurlngdielectrictesting,Section3providesdefinitionsoftermsrelatedtomeasurements,statestherequire-mentswhichthemeasuringsystemsshallmeet,anddescribessomeofthedevicesused.Section4,anap-plicationguideformeasuringde-vices,providesinformationonmeasuringsystemsanddevicesusedforthemeasurementofhigh-voltageorcurrentsduringtheperformanceofdielectrictests,anddescribesmeasuringandcalibrationprocedures.Section5addressestheuseofthespheregapforthemeasurementofpeakvalueandde-scribesthegeometryofthestandardspheregap,definesitsconnections,outlinesitsuse,andprovidesspheregapdisruptive-dischargevoltagedata,includingtheinfluenceofat-mosphericdata,thesourcesofthesedata,andthetolerancesortheac-curacy.ThisSixthEditionhaschangedthestandardreferencetemperaturefrom25OCto2OoCtoagreewithiECpractice,andincludesspecificationsforwettestsandswitchingimpulsetests,arevisedwettestprocedure,contaminationtestingprocedures,andanapplicationguideformeasur-ingdevices.AnAmericanNationalStandardIEEEStandardTechniquesforHigh-VoltageTestingPublishedbyTheInstituteofElectricalandElectronicsEngineers,IncDistributedincooperationwithWiley-Interscience,adivisionofJohnWiley&Sons,Inc@Copyright1978byTheInstituteofElectricalandElectronicsEngineers,IncNopartofthispublicationmaybereproducedinanyform,inanelectronicretriedsystemorotherwise,withoutthepriorwrittenpermissionofthepublisher.ANSI/IEEEStd4-1978(RevisionofIEEEStd4-1969)AnAmericanNationalStandardIEEEStandardTechniquesforHigh-VoltageTesting6thEditionSponsorPowerSystemInstrumentationandMeasurementsCommitteeoftheIEEEPowerEngineeringSocietyApprovedApril26,1982AmericanNationalStandardsInstitute,IncApprovedMarch3,1977IEEEStandardsBoardWilliamR.Kruesi,ChairmanIrvinN.Howell,Jr,ViceChairmanIvanG.Easton,SecretaryWilliamE.AndrusJeanJacquesArchambaultMarkBarberEdwardJ.CohenWarrenH.CookLouisCostrellR.L.CurtisDavidB.DobsonR.0.DuncanCharlesW.FlintJayForsterRalphI.HauserJosephL.KoepfingerIrvingKolodnyBenjaminJ.LeonThomasJ.MartinDonaldT.MichaelVossA.MooreWilliamS.MorganWilliamJ.NeiswenderRalphM.ShowersRobertA.SodermanLeonardW.Thomas,SrB.W.WhittingtonSH06965Foreword(ThisForewordisnotapartofIEEEStd4-1978,StandardTechniquesforHigh-VoltageTesting.)Thisstandardestablishesstandardmethodsofmeasurementofhighvoltageandbasictestingtechniquessofarastheyaregenerallyapplicabletoalltypesofap-paratusforalternatingvoltages,directvoltages,lightningimpulsevoltages,switchingimpulsevoltages,andimpulsecurrents.Thisstandardconsistsofthefollowingsections:Section1:GeneralDefinitionsandTestRequirementsSection2:TestProceduresSection3:MeasuringDevicesSection4:MeasuringDevicesApplicationGuideSection5:VoltageMeasurementsbyMeansofSphereGapsThesesectionsarebasedonandadhereverycloselytothefollowingIECHigh-IECPublication6041973)--GeneralDefinitionsandTestRequirementsIECPublication60-2(1973)-TestProceduresIECPublication60-3(1976)-MeasuringDevicesIECPublication60-4(1977)-MeasuringDevicesApplicationGuideIECPublication52(1960)-RecommendationsforVoltageMeasurementbyMeansofSphereGapsThecurrentrevisionofIEEEStd4isthesixtheditionofthisdocumentasasepa-ratestandard.ThesubjecthadbeenaddressedintheearliestStandardizationReportoftheAmericanInstituteofElectricalEngineers(AIEE)in1899andhadbeensub-stantiallyelaborateduponinthesubsequentreportsissuedfrom1902to1933.Whenitwasdecided,in1922,toreorganizetheInstitute’sstandardsintoseparatesections,measurementoftestvoltagesbecameoneofthefirstsubjectstobedesignatedforseparatepublication.Thefirsteditionwaspublishedin1928.In1956,atthemeetingofTechnicalCommitteeNo42oftheIfiternationalElectro-technicalCommission(IEC)inMunich,itwasagreedthatnewspheregaptablesshouldbepreparedwhichcouldbeacceptedinternationally.ThenewtablesweretobethemeanofthevaluesacceptedbytheIECinJuly1939andthevaluesinAIEENo4-1953(afteradjustmentfortemperature).TherevisionofAIEENo4-1953,IEEEStd4-1969,reflectedthosenewvaluesandwasbaseduponIECPublication52(1960).InthiscurrentrevisionofIEEEStd4,thestandardreferencetemperaturehasbeenchangedfrom25°Cto20°CtoagreewithIECpractice.AsaresultthespheregapvaluesarenowthesameasthoseinIECPublication52(1960).IncludedinthisdocumentarespecificationsforwettestsandswitchingimpulsetestswhichsupersedeAIEENo29-1941andIEEEStd332-1972(ANSIC68.2-1972)respectively.Alsoincludedarearevisedwettestproce