JIS C5402-10-4-2006 电子设备连接器.试验和测量.第10-4部分冲击试验(自由元件

C5402-10-42006(IEC60512-10-42003)114121(JEITA)JISC5402-10-4:2002IEC60512-10-4:2003ConnectorsforelectronicequipmentTestsandmeasurementsPart10-4:Impacttests(freecomponents),staticloadtests(fixedcomponents),endurancetestsandoverloadtestsTest10d:Electricaloverload(connectors)JISC5402-10-4AJISC5402JISC5402-1-1001-100C5402-10-42006(IEC60512-10-42003)························································································································································································11.························································································································································12.·········································································································································································23.····································································································································································24.·········································································································································································25.························································································································································26.···········································································································································2A···································································4JISC5402-10-42006(IEC60512-10-42003)10-410dConnectorsforelectronicequipment―Testsandmeasurements―Part10-4:Impacttests(freecomponents),staticloadtests(fixedcomponents),endurancetestsandoverloadtests―Test10d:Electricaloverload(connectors)20032IEC60512-10-4ConnectorsforelectronicequipmentTestsandmeasurementsPart10-4:Impacttests(freecomponents),staticloadtests(fixedcomponents),endurancetestsandoverloadtestsTest10d:Electricaloverload(connectors)1.100ms20s1.2.ISO/IECGuide21IDTMODNEQIEC60512-10-4:2003ConnectorsforelectronicequipmentTestsandmeasurementsPart10-4:Impacttests(freecomponents),staticloadtests(fixedcomponents),endurancetestsandoverloadtestsTest10d:Electricaloverload(connectors)(IDT)2C5402-10-42006(IEC60512-10-42003)2.JISC5402-1-11-11aIEC60512-1-1:2002ConnectorsforelectronicequipmentTestsandmeasurementsPart1-1:GeneralexaminationTest1a:VisualexaminationJISC5402-2-12-12aIEC60512-2-1:2002ConnectorsforelectronicequipmentTestsandmeasurementsPart2-1:ElectricalcontinuityandcontactresistancetestsTest2a:ContactresistanceMillivoltlevelmethodJISC5402-13-113-113aIEC60512-13-1:2002Connectorsforelectronicequipment-Basictestingandmeasurements:Part13-1:Test13a:EngagingandseparatingforcesIEC60512-7:1993Electromechanicalcomponentsforelectronicequipment;basictestingproceduresandmeasuringmethodsPart7:Mechanicaloperatingtestsandsealingtests3.34.AA.1AA.2100ms20s535.JISC5402-2-1JISC5402-13-1IEC60512-7JISC5402-1-13C5402-10-42006(IEC60512-10-42003)6.a)b)c)d)e)f)g)4C5402-10-42006(IEC60512-10-42003)Atbeubttt−=tuteIBA1tA2tb=85°C,A2る。5C5402-10-42006(IEC60512-10-42003)A2A2