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!,!#$:,,º:;;;!、,SF6(GIS)。,,GIS－－－[1],。、,/,;,,;,,1。1,,,。#,1,、,、,。3.1,、、、。:y=k·x(1)x－－－y－－－k－－－、,:y=k·x+b(2):Ep=b1Fig.1Diagramoftestingsystemforeletroniinstrumenttransformer42112005116789:;=?=Vol.42Nov,-.,!No.11200542Ek=k-kE$%=&’()yi-k·xi-b*3.2。,,。:e+t,=A-·./0+1!ft2,(3)A-－－－f－－－－－－,:a+t,=A·./0+1!ft2#,2d(4)A－－－$－－－d－－－,Ek=AA-5k,E-=d,:E6=7n57·ni=7Σ+xi5A·./0+1!fti2$,5d,[]171(8):Ei=91:;·A-1(b),:EB=b5=?1ErEi。fx@1A:E’=E-2Ek·xB98·A-1EBA-,、。,,。!、,,。,。,,,。4.1,,,:y=a2a7·yt2…2ah·yth(C)yt－－－y－－－a,a7,…,ah－－－h－－－,(C),,,,,,:y=a+t,2a7+t,·yt2…2ah+t,·yth(D)a+t,Ea7+t,E…Eah+t,－－－,t,(D),tyt,,tyt。,,,,,,。,。,。4.2tyt,,,@3A:y=b2b7·yt2b1·t(:),@3A,。5.1,1。1,!:11,(6),4。2,。,,,。。5.2(7),。,h,a(t)～ah(t)。:a(t)～ah(t),h。3h,a(t)～ah(t)4。,。,5,;,4。,,54。,,。5.3,,4。4,,。,,。,,2Fig.2Testingresultsofdataaquisitionsystem3Fig.3Errorompensation!42:2003-09-04:(1973-),,,,、、。Com$%&’()*o&o+,-.$-/()0/%1//o/o23()(45607’7)7o&89’)-.7&1:%5)/o&75;o)o%:%5)/75=o.7&-?@&’)/0.-&),/A&’2o/.-/!#$%&’()(BeihangUniversity,Beijing100083,China)4B’)/AC):Thestructureoftestingsystemofelectronicphotoelectriccombinedinstrumenttrans-formerisintroduced.Thecharacteristicsofitsdataacquisitionsystemareanalyzed.Anewtem-peraturecompensationalgorithmispresented.D-9Eo/F’:!#$%&’()$)(*%&+,-(%%&.(*/’&,-&;01%11$2+)*)%)’(;3-,4-&1%1&-$51&1$%-&)*%)$;!&&’&$’,4-(*1%)’(。!(1)、,,,,－－－,。(2),,,,。,DSP,。:[1]PeterH,DieterF,AlexanderK.Passforretrofitting,Ex-tendingandconstructingnewhigh-voltagesubstations[J].ABBReview,1998,2,12-20.[2],,.[J].,1997,17(2):18-20.[3].[M].:,1985.4G7HIJ=o.$A/7’o&o2)EoCo.$-&’A)7&H.-)oF’!