3(05nm050280):,1983,,E2mail:sfm_208@163.com31,2,1,2,1,2,1,2(1,200092;2,200092),XRD,,2CuZn4ESEMTEM,,,,Si,Si,StudyonMicrostructureMorphologyofZn2AlBasedAlloyPreparedbyRapidSolidificationSIFuming1,2,LOUHaiyi1,2,YANBiao1,2,TANGRenjian1,2(1SchoolofMaterialsScienceandEngineering,TongjiUniversity,Shanghai200092;2ShanghaiKeyLab.ofD&AforMetal2FunctionalMaterials,Shanghai200092)AbstractZn2AlbasedalloywithhighSicontentispreparedbysingle2rollerrapidsolidificationmethodinthisreport.ThephasetransformationcharacteristicisinvestigatedbyX2raydiffractionandthemicrostructureisobservedthroughenvironmentalscanningelectronmicroscopy(ESEM)togetherwithtransmissionelectronmicroscopy(TEM).ItisconcludedthatthesupersaturatedphasephasephaseandsinglecrystalSiexistinthesampleandthecrystal2linegrainisfineandequiaxed.SeveresegregationofhighSiisnotdetected.Keywordsrapidsolidification,ZAalloy,microstructure,equiaxedcrystalline0,,,[1],,[2],,,[35],[6,7],1(1),:(1#A00,Si),,,,,,,45mm,85m1Table1ElementsofalloyAlCuSiZn/wt%3226PhilipsAnalytical(CuKNi)XRD,PhilipsXL230ESEM,,,4%,,,,H2800(TEM)22.1XRDX(1),,,334/2CuZn4,,,,[8]2CuZn4[9]Si6%,Si(2),XRDSi1001h,X(3),,,,SiSi,Si(110)39,,Si[1012]1XFig.1XRDpatternofas2receivedalloy2Fig.2EPSofas2receivedalloy31001hXFig.3XRDpatternofalloyagedat100after1hour2.2ESEMTEM(ESEM)(4),(5),120,,,,,,[13](6)4ESEMFig.4ESEMmicrographofas2receivedalloy5ESEM(20000)Fig.5ESEMmicrographofalloyinterfaces(20000)6ESEM(5000)Fig.6ESEMmicrographofequiaxedcrystalline(5000)ESEM(7),,,,,,XRD,,(1414),,,,,,5%,,,,,,4342007521Si,,,,,,[14],6%7SiESEM(20000)Fig.7ESEMmicrographofSiinas2receivedalloy(20000)TEM(8),,1XRD,,,,[15],8TEMFig.8TEMmicrographofas2receivedalloy3(1)Zn2Al,2CuZn4(2),,120,(3)SiZn2Al,,6%Si1ChangLM,ChenML,YanCK.JMaterSciLett,1998,17:9032,..:,1994.23,,.ZA27.,2006,(55):5894,,.ZA27.,2003,(13):1735,.ZA27.,2002,(12):2946,.ZA27.,2001,(6):267,,.ZA2724%Si.,2005,(26):288,,..:,2001.1149,,.(ZA27)[A].94,,1994.33610..,2003,24(3):20611,..,2001,(4):1412,,..,2006,30(1):1513,,..,2002,(23):13314..:,1993.2315ZhuYH,etal.ExothermicreactioninevtectoidZn2Albasedalloys.MaterSciEngA,1999,268:147534/