工业射线照相的发展史

(,214028):,20a():;;:TG115.28:A:100026656(2003)0520252205HISTORYOFINDUSTRIALRADIOGRAPHYLIYan(WuxiHuaguangBoilerCo.Ltd.,Wuxi214028,China)Abstract:Theearlyhistoryoftheapplicationofradiographytoindustrialnondestructivetestingwasoutlinedanditsnewde2velopmentinrecent20yearswasalsoreviewed.Itwaspointedoutthatfilmradiographywasstillthemainaspectinindustrialra2diographicnondestructivetestingtoday.Keywords:Radiography;Development;Survey1X106aX189511,,,2m,X,,,,15mm,,1901X,,,2X[13]2.11896,:2002201223,(CampbellSwinton)X,(Wright)X4mm,;X,,,1908X,(Mcintyre),2.21913,(WilliamDCoolidge)X(,)(),,,,,(Gaede),0.0133Pa(1.33310-7Pa)25225520035NDTVol.25No.5May2003©1995-2003TsinghuaTongfangOpticalDiscCo.,Ltd.Allrightsreserved.1916()+12.7mm,,1917(Woolwich),1922200kVX,1926,RBerthold,,,,1930JCHogde19311a,(BabcockWilcox)X(ASTM),1937E27,2.3X,,,,,,,,,1932,,300kV,8mA1933400kV,20mA,X(),75110mm1933,X1MV,2MV19421MV,,197936a,2MV,40501MV1941(Kerst),4.5MeV,X,,2050,(VanderGraff),,,(Varian)(Dynamics)125MeV,X5.1610-26145C/kgminm(20025000R/minm),,(Shongburg)4MeV(1957),2070,12MeV2.4,1929,1939121941200,1001933,,,3000X(100250kV),,,,31896X,(HenriBecquerel),,352:©1995-2003TsinghuaTongfangOpticalDiscCo.,Ltd.Allrightsreserved.,,X,,30a,,4[4]4.1(226Ra)1925(Pilon)(Laborde),19291930,,242mg,3.5mm,14mm10/mg,1h1938,194011,218g1941X,,222Rn,Ra2CRa2B,3.8d,,0.5mm,6d,9kg,1.111011Bq(3Ci)7.41010Bq(2Ci)60Co,,19521953,(AEREHarwell),4.22050182Ta115d,1.22MeV,60Co,182Ta5.3a,182Ta60CoX,(50mm)19521953,192Ir0.130.89MeV,0.310.47MeV,74d,2mm2mm1.111012Bq(30Ci)192Ir10100mm,1953170Tm,127d,(90,125,260,470kV),,169Yb1970,169Yb0.0630.31MeV,31d,8.710-8C/kgBqm(125mR/Cim)169Yb250300kVX,(3.711.1)1010Bq(13Ci)0.6mm0.6mm;(3.711.1)109Bq(100300mCi)0.3mm0.3mm,,1994,,199475Se75Se0.18,0.27,0.4MeV,118d,430mm133Xe,152Eu,24Na,125I,241Am,153Sm,54Mn,144Ce,153Gd192Ir60Co,40XX,5[5],5.1452:©1995-2003TsinghuaTongfangOpticalDiscCo.,Ltd.Allrightsreserved.X,,,1914X,X,,,1913,1918,,,1924,5.22030,,,ASME(1930),,X,,20401938S(S2Screen,)1942,,X,(),,D(D2Direct,),D,2040,,5.32050,,,,1956,X2O2mar1962(2630)(812min),(),;12,CX,AA,AX,T,MX,M,B,P,G,D,DRSR,(P)2.5min,,X,20s5.42080ISO/DIS7004:1985ISO199418EN58421,2:1994,2.04.0Gmin,2.0Dmax2.0(G/D)min,C1C6,ASMESE21815:1996AHISO116992,:1998T1T4,6[6](,)60a,X,,,,,,,,552:©1995-2003TsinghuaTongfangOpticalDiscCo.,Ltd.Allrightsreserved.,,,RHalmshow1941,,BUiUi,,X,UDD,(),7[7]20a,,X(),,,X(RTR),,,RTR25Lp/mm,1020Lp/mmX(RGX),12mm,,(x/x)(RGX0.2%,0.5%)[8]:[1]HalmshawR.ThediscoveryofX2rayandtheearlyhistoryofindustrialradiography[J].Insight,1995,37(9):669-671.[2]BeckerGeoreL.RadiographicNDT[M].NewYork:EIDuPontdeNemours&CoInc,1990.1-5.[3]GeraldGardnerC.NondestructiveTesting[M].WashingtonDC:TechnologyUtilizationOffice,NationalAeronautics&SpaceAdministration,64.[4]HalmshawR.TheearlyhistoryofthediscoveryofX2rays,2raysandindustrialradiography[A].14thWCNDT[C].NewDelhiIndia:1996.27-32.[5]KnellM.AbriefhistoryofX2rayfilm[J].Insight,1995,37(9):637-675.[6]HalmshawR.IndustrialRadiology:TheoryandPractice[M].London&NewJersey:AppliedSciencePublishersLtd,1982.66-75.[7]HalmshawR,RidyardN.Areviewofdigitalradiologicalmethods[J].BritishJNDT,1990,32(1):17-26.[8]AlbertThomasM.X2raysystemapplicationsusingreversegeometryforhighsensitivity[J].MaterialsEvaluation,1993,51(12):1020-1023.2003GBJB,;;,;,,,,,:298(,10%):99,:200437,:0212655567752311()652:©1995-2003TsinghuaTongfangOpticalDiscCo.,Ltd.Allrightsreserved.