JIS Z3198-4-2003 英文版 无铅焊剂的试验方法.第4部分用湿平衡法和接触角法测定钎焊性

JISJAPANESEINDUSTRIALSTANDARDTranslatedandPublishedbyJapaneseStandardsAssociationJISZ3198-42003Testmethodsforlead-freesolders-Part4:MethodsforsolderabilitytestbyawettingbalancemethodandacontactanglemethodICs25.160.50Referencenumber:JISZ3198-4:2003(E)PROTECTEDBYCOPYRIGHTCopyrightJapaneseStandardsAssociationProvidedbyIHSunderlicensewithJSALicensee=HongKongPolytechnicUniv/9976803100NotforResale,08/01/200904:28:45MDTNoreproductionornetworkingpermittedwithoutlicensefromIHS--```,`,,`,,,````,,,```,,``,`-`-`,,`,,`,`,,`---Z3198-4:2003ForewordThistranslationhasbeenmadebasedontheoriginalJapaneseIndustrialStandardestablishedbytheMinisterofEconomy,TradeandIndustrythroughdeliberationsattheJapaneseIndustrialStandardsCommitteeaccordingtotheproposalofestablishingaJapaneseIndustrialStandardfromTheJapanWeldingEngineeringSociety(JWES),withadraftofIndustrialStandardbasedontheprovisionofArticle12Clause1oftheIndustrialStandardizationLaw.SolderingiscalledHANDAZUm(Japanese),atechniquetobeusedformountingelectronicandelec-tricalmachineryandapparatus,communicationequipmentandthelikeanditsusefieldiswideandexpectationforhighreliabilityoftheconnectionislarge.ThoughtherearestandardsinsideandoutsideJapanaswellasInternationalStandardslikeIECorISO,thisStandardusesresultsof?standardizationoftestmethodsandthelikenecessaryforsolderconnectioncorrespondingtothereductionofanenvironmentalload?basedontheresearchanddevel-opmentbycontractofNewEnergyandIndustrialTechnologyDevelopmentOrganization.ThisStandardconcernsthemethodsforsolderabilitytest(wettingbalancemethodandacontactanglemethod)oflead-freesolderswhichareenvironmentallyfriendlyandispositionedasastandardforconsideringenvironment.BeinginconformancewiththisStandardmaycomeundertheuseofthefollowingpatentrights:QDenominationofinventionPatent:PlanedirectiondetectingapplianceaDenominationofinventionPatent:Planedirectiondetectingappliance0DenominationofinventionPatent:ContactanglemeasuringapplianceDateofregistrationoftheinvention:August16,2002DateofdecisionofgrantapatenkOctober22,2002Dateofdecisionofgrantapatent:September3,2002Besides,thisdescriptiondoesnotaffecttoanyextentthevalidity,thescopeandthelikeoftheabovepatentrights.TheholdersofthesepatentrightsgiveguaranteetotheJapaneseIndustrialStandardsCommitteewithrespecttohiswillingnesstopermitanyonetoexercisetherelevantpatentrightunderthenondis-criminatoryandreasonableconditions.Inthisregard,howeverholdersofotherindustrialpropertiesrelatedtothisStandardaresubjecttopermittheirinventions?exercisesinexactlysameconditionabovementioned.AttentionisdrawntothepossibilitythatsomepartsofthisStandardmayconflictwithapatentright,applicationforapatentafteropeningtothepublic,utilitymodelrightorapplicationforregistrationofutilitymodelafteropeningtothepublicwhichhavetechnicalproperties.TherelevantMinisterandtheJapaneseIndustrialStandardsCommitteearenotresponsibleforidentifyingthepatentright,applicationforapatentafteropeningtothepublic,utilitymodelrightorapplicationforregistrationofutilitymodelafteropeningtothepublicwhichhavethesaidtechnicalproperties.JISZ3198includesthefollowing7partswiththegeneraltitleTestmethodsforlead-freesoldersPart1:MethodsformeasuringofmeltingtemperaturerangesPart2:Methodsfortestingofmechanicalcharacteristics-tensiletestPart3:MethodsforspreadtestPart4:MethodsforsolderabilitytestbyawettingbalancemethodandacontactanglemethodPart5:MethodsfortensiletestsandsheartestsORsolderjointsPart6IMethodsfor45OpulltestofsolderjointsonQFPleadPart7:MethodsforshearstrengthofsolderjointsonchipcomponentsDateofEstablishment:2003-06-20DateofPublicNoticeinOfficialGazette:2003-06-20Investigatedby:JapaneseIndustrialStandardsCommitteeStandardsBoardTechnicalCommitteeonWeldingJISZ3198-4:2003,FirstEnglisheditionpublishedin2003-12Translatedandpublishedby:JapaneseStandardsAssociation4-1-24,Akasaka,Minato-ku,Tokyo,107-8440JAPANIntheeventofanydoubtsarisingastothecontents,theoriginalJISistobethefinalauthority.OJCA2003Allrightsreserved.Unlessotherwisespecified,nopartofthispublicationmaybereproducedorutilizedinanyformorbyanymeans,electronicormechanical,includingphotocopyingandmicrofilm,withoutpermissioninwritingfromthepublisher.PrintedinJapanPROTECTEDBYCOPYRIGHTCopyrightJapaneseStandardsAssociationProvidedbyIHSunderlicensewithJSALicensee=HongKongPolytechnicUniv/9976803100NotforResale,08/01/200904:28:45MDTNoreproductionornetworkingpermittedwithoutlicensefromIHS--```,`,,`,,,````,,,```,,``,`-`-`,,`,,`,`,,`---Z3198-4:2003ContentsPageIntroduction.................................................................................................................12344.14.24.34.44.556Scope....................................................................................................................Normativereferences........................................................................................Definitions..........................................................................................................Testmethod.................................................................